S-1701A2728-M5T1G SII [Seiko Instruments Inc], S-1701A2728-M5T1G Datasheet - Page 30

• Manufacturer Part Number: S-1701A2728-M5T1G
• Description: HIGH RIPPLE-REJECTION LOW DROPOUT CMOS VOLTAGE REGULATOR WITH RESET FUNCTION
• Manufacturer: SII [Seiko Instruments Inc]

*1. V
*2. The output current at which the output voltage becomes lower than 95% of V
*3. V
*4. The change in temperature [mV/°C] of the regulator output voltage is calculated using the following equation.
*5. −V
*6. The change in temperature [mV/°C] of the detector detection voltage is calculated using the following equation.
*7. The output current can be at least this value.
*8. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
30
HIGH RIPPLE-REJECTION LOW DROPOUT CMOS VOLTAGE REGULATOR WITH RESET FUNCTION
S-1701 Series
Detector block
Detection voltage
Hysteresis width
Output current
Detection voltage
temperature
coefficient
Delay time
Input voltage
Current leakage of
output transistor
V
The output voltage when fixing I
V
V
*1. The change in temperature of the output voltage
*2. Specified output voltage
*3. Output voltage temperature coefficient
*1. The change in temperature of the detection voltage
*2. Specified detection voltage
*3. Detection voltage temperature coefficient
Due to restrictions on the package power dissipation, this value may not be satisfied. Attention should be paid to the power
dissipation of the package when the output current is large. This specification is guaranteed by design.
not tested in production.
∆−V
∆
∆
OUT(S)
OUT(E)
drop
OUT3
IN1
∆Ta
V
DET
Ta
Parameter
OUT
is the input voltage at which the output voltage becomes 98% of V
= V
DET
: Actual detection voltage, −V
is the output voltage when V
: Specified output voltage
: Actual output voltage at the fixed load
[
mV/
*6
IN1
[mV/°C]
− (V
°
C
*5
]
OUT3
*1
=
*1
V
× 0.98)
= −V
∆Ta
OUT(S)
−V
V
I
t
V
I
DOUT
D
LEAK
HYS
IN
∆−V
Symbol
DET
[ ]
DET(S)
•
V
−V
DET
2 *
DET
×
(Typ.) [V]
OUT
∆
IN
DET(S)
Ta
Nch, V
−40 ≤ Ta ≤ +85 °C
No delay (t
t
t
V
(= 30 mA) and inputting V
∆
D
D
= V
IN
V
= 50 ms
= 100 ms
•
= 6.5 V, V
OUT
: Specified detection voltage
V
OUT(S)
*2
DOUT
OUT
×
[
ppm/
∆Ta
D
+ 1.0 V and I
= 0.5 V
∆−V
= 60 µs)
DOUT
•
°
−V
DET
C
Seiko Instruments Inc.
*8
= 6.5 V
]
DET
3 *
Conditions
÷
Table 30 (2/2)
[ppm/°C]
OUT
1000
−
−
V
(1.5 V ≤ −V
V
(2.1 V ≤ −V
V
(3.1 V ≤ −V
V
(4.1 V ≤ −V
V
(5.1 V ≤ −V
−
IN
IN
IN
IN
IN
OUT(S)
= 100 mA.
= 1.4 V
= 2.0 V
= 3.0 V
= 4.0 V
= 5.0 V
+ 1.0 V
*3
÷ 1000
DET(S)
DET(S)
DET(S)
DET(S)
DET(S)
OUT3
after gradually decreasing the input voltage.
≤ 5.5 V)
≤ 5.5 V)
≤ 5.5 V)
≤ 5.5 V)
≤ 5.5 V)
OUT(E)
after gradually increasing the output current.
(Ta = 25 °C unless otherwise specified)
−V
× 0.99
× 0.65
Min.
1.0
2.0
3.0
4.0
5.0
0.8
DET(S)
t
3
−
−
−
D
−V
±140
Typ.
3.0
4.5
5.5
6.0
6.5
60
DET(S)
t
5
−
−
D
−V
× 1.01
× 1.35
±550
Max.
100
6.5
0.1
DET(S)
t
7
−
−
−
−
−
D
Rev.2.4
ppm/
Unit
mA
mA
mA
mA
mA
ms
ms
°C
µA
µs
%
V
V
Circuit
Test
14
14
15
15
15
15
15
14
14
14
14
15
−
_00