STM32F205REY6TR STMicroelectronics, STM32F205REY6TR Datasheet - Page 93
STM32F205REY6TR
Manufacturer Part Number
STM32F205REY6TR
Description
ARM Microcontrollers - MCU 32-Bit ARM Cortex 512kb Connectivity
Manufacturer
STMicroelectronics
Datasheet
1.STM32F207VFT6TR.pdf
(177 pages)
Specifications of STM32F205REY6TR
Product Category
ARM Microcontrollers - MCU
Rohs
yes
Core
ARM Cortex M3
Data Bus Width
32 bit
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STM32F20xxx
Table 39.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
●
●
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC
standard which specifies the test board and the pin loading.
V
V
Symbol
FESD
EFTB
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Fast transient voltage burst limits to be
applied through 100 pF on V
pins to induce a functional disturbance
EMS characteristics
®
code, is running. This emission test is compliant with SAE IEC61967-2
Parameter
Doc ID 15818 Rev 9
DD
and V
SS
V
f
IEC 61000-4-2
V
f
IEC 61000-4-2
HCLK
HCLK
DD
DD
= 3.3 V, LQFP100, T
= 3.3 V, LQFP100, T
= 75 MHz, conforms to
= 75 MHz, conforms to
Conditions
Electrical characteristics
A
A
= +25 °C,
= +25 °C,
Level/
Class
93/177
2B
4A
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