XCF02SVO20C Xilinx Inc, XCF02SVO20C Datasheet - Page 7

• Manufacturer Part Number: XCF02SVO20C
• Description: IC PROM IN SYST PRG 3.3V 20TSSOP
• Manufacturer: Xilinx Inc

Specifications of XCF02SVO20C

• Programmable Type: In System Programmable
• Memory Size: 2Mb
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 20-TSSOP (0.173", 4.40mm Width)
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Platform Flash PROM TAP Characteristics
The Platform Flash PROM family performs both in-system
programming and IEEE 1149.1 Boundary-Scan (JTAG) testing
via a single 4-wire Test Access Port (TAP). This simplifies
system designs and allows standard Automatic Test
Equipment to perform both functions. The AC characteristics
of the Platform Flash PROM TAP are described as follows.
X-Ref Target - Figure 4
TAP AC Parameters
Table 9
Table 9: Test Access Port Timing Parameters
DS123 (v2.18) May 19, 2010
Product Specification
T
T
T
T
T
T
CKMIN
MSS
MSH
DIS
DIH
DOV
Symbol
shows the timing parameters for the TAP waveforms shown in
TMS
TDO
TCK
TDI
R
TCK minimum clock period when V
TMS setup time when V
TMS hold time when V
TDI setup time when V
TDI hold time when V
TDO valid delay when V
T
CKMIN
T
DIS
T
MSS
CCJ
CCJ
CCJ
CCJ
CCJ
Figure 4: Test Access Port Timing
= 2.5V or 3.3V
= 2.5V or 3.3V
= 2.5V or 3.3V
= 2.5V or 3.3V
= 2.5V or 3.3V
Description
CCJ
www.xilinx.com
Platform Flash In-System Programmable Configuration PROMs
= 2.5V or 3.3V
T
DIH
T
MSH
TAP Timing
Figure 4
These TAP timing characteristics are identical for both
Boundary-Scan and ISP operations.
Figure
shows the timing relationships of the TAP signals.
T
DOV
4.
Min
67
25
25
8
8
–
DS123_04_031808
Max
22
–
–
–
–
–
Units
ns
ns
ns
ns
ns
ns
7