DS26334DK Maxim Integrated Products, DS26334DK Datasheet - Page 97
DS26334DK
Manufacturer Part Number
DS26334DK
Description
KIT DESIGN FOR DS26334
Manufacturer
Maxim Integrated Products
Specifications of DS26334DK
Main Purpose
Telecom, Line Interface Units (LIUs)
Utilized Ic / Part
DS26334
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Secondary Attributes
-
Embedded
-
Primary Attributes
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
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Table 7-2. ID Code Structure
MSB
Version
Contact Factory
4 bits
Table 7-3. Device ID Codes
7.3 Test Registers
IEEE 1149.1 requires a minimum of two test registers: the Bypass Register and the Boundary Scan Register. An
optional test register has been included with the DS26334 design. This test register is the Identification Register
and is used with the IDCODE instruction and the Test-Logic-Reset state of the TAP controller.
7.3.1 Boundary Scan Register
This register contains both a shift register path and a latched parallel output for all control cells and digital I/O cells
and is n bits in length.
7.3.2 Bypass Register
This register is a single 1-bit shift register used with the BYPASS, CLAMP, and HIGHZ instructions that provide a
short path between TDI and TDO.
7.3.3 Identification Register
The Identification Register contains a 32-bit shift register and a 32-bit latched parallel output. This register is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state. See
7-2
and
DS26334
DEVICE
Table 7-3
for more information about bit usage.
Device ID
16 bits
16-BIT ID
003Ch
DS26334 3.3V, 16-Channel, E1/T1/J1 Short/Long-Haul Line Interface Unit
JEDEC
00010100001
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LSB
1
1
Table
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