MC56F8145VFGE Freescale Semiconductor, MC56F8145VFGE Datasheet - Page 124

• Manufacturer Part Number: MC56F8145VFGE
• Description: IC DSP 16BIT 40MHZ 128-LQFP
• Manufacturer: Freescale Semiconductor
• Series: 56F8xxxr

Specifications of MC56F8145VFGE

• Core Processor: 56800
• Core Size: 16-Bit
• Speed: 40MHz
• Connectivity: EBI/EMI, SCI, SPI
• Peripherals: POR, PWM, WDT
• Number Of I /o: 49
• Program Memory Size: 128KB (64K x 16)
• Program Memory Type: FLASH
• Ram Size: 4K x 16
• Voltage - Supply (vcc/vdd): 2.25 V ~ 3.6 V
• Data Converters: A/D 16x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 105°C
• Package / Case: 128-LQFP
• Data Bus Width: 16 bit
• Processor Series: MC56F81xx
• Core: 56800E
• Data Ram Size: 4 KB
• Interface Type: SCI, SPI
• Maximum Clock Frequency: 40 MHz
• Number Of Programmable I/os: 49
• Number Of Timers: 8
• Maximum Operating Temperature: + 105 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 4 x 12 bit, 4 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

EXAMPLE 1: If the system clock is the 8MHz crystal frequency because the PLL has not been set up,
the input clock will be below 12.8MHz, so PRDIV8 = FM_CLKDIV[6] = 0. Using the following equation
yields a DIV value of 19 for a clock of 200kHz, and a DIV value of 20 for a clock of 190kHz. This
translates into an FM_CLKDIV[6:0] value of $13 or $14, respectively.
EXAMPLE 2: In this example, the system clock has been set up with a value of 32MHz, making the FM
input clock 16MHz. Because that is greater than 12.8MHz, PRDIV8 = FM_CLKDIV[6] = 1. Using the
following equation yields a DIV value of 9 for a clock of 200kHz, and a DIV value of 10 for a clock of
181kHz. This translates to an FM_CLKDIV[6:0] value of $49 or $4A, respectively.
Once the LOCKOUT_RECOVERY instruction has been shifted into the instruction register, the clock
divider value must be shifted into the corresponding 7-bit data register. After the data register has been
updated, the user must transition the TAP controller into the RUN-TEST/IDLE state for the lockout
sequence to commence. The controller must remain in this state until the erase sequence has completed.
For details, see the JTAG Section in the 56F8300 Peripheral User Manual.
Note:
7.2.4
The recommended method of unsecuring a programmed device for product analysis of field failures is via
124
When the lockout recovery sequence has completed, the user must reset both the JTAG TAP controller
(by asserting TRST) and the device (by asserting external chip reset) to return to normal unsecured
operation.
Product Analysis
150[kHz]
150[kHz]
56F8345 Technical Data, Rev. 17
<
<
(
(
SYS_CLK
SYS_CLK
(DIV + 1)
(DIV + 1)
(2)
(2)
)
)
<
<
200[kHz]
200[kHz]
Freescale Semiconductor
Preliminary