MCP6293T-E/MS Microchip Technology, MCP6293T-E/MS Datasheet - Page 4

• Manufacturer Part Number: MCP6293T-E/MS
• Description: IC OPAMP 2.4V SNGL CS R-R 8MSOP
• Manufacturer: Microchip Technology

Specifications of MCP6293T-E/MS

• Amplifier Type: General Purpose
• Number Of Circuits: 1
• Output Type: Rail-to-Rail
• Slew Rate: 7 V/µs
• Gain Bandwidth Product: 10MHz
• Current - Input Bias: 1pA
• Voltage - Input Offset: 3000µV
• Current - Supply: 1mA
• Current - Output / Channel: 25mA
• Voltage - Supply, Single/dual (±): 2.4 V ~ 6 V
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 8-MSOP, Micro8™, 8-uMAX, 8-uSOP,
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• -3db Bandwidth: -

MCP6291/1R/2/3/4/5
TEMPERATURE SPECIFICATIONS
FIGURE 1-1:
Chip Select (CS) pin on the MCP6293 and
MCP6295.
DS21812E-page 4
Electrical Characteristics: Unless otherwise indicated, V
Temperature Ranges
Operating Temperature Range
Storage Temperature Range
Thermal Package Resistances
Thermal Resistance, 5L-SOT-23
Thermal Resistance, 6L-SOT-23
Thermal Resistance, 8L-PDIP
Thermal Resistance, 8L-SOIC
Thermal Resistance, 8L-MSOP
Thermal Resistance, 14L-PDIP
Thermal Resistance, 14L-SOIC
Thermal Resistance, 14L-TSSOP
CS
V
I
I
SS
CS
Note:
OUT
-0.7 µA
(typical)
0.7 µA
(typical)
Hi-Z
The Junction Temperature (T
Parameters
V
t
IL
ON
Timing Diagram for the
-1.0 mA
(typical)
10 nA
(typical)
J
) must not exceed the Absolute Maximum specification of +150°C.
V
0.7 µA
(typical)
IH
t
-0.7 µA
(typical)
OFF
Sym
θ
θ
θ
θ
θ
θ
θ
θ
T
T
Hi-Z
JA
JA
JA
JA
JA
JA
JA
JA
A
A
DD
= +2.4V to +5.5V and V
Min
-40
-65
—
—
—
—
—
—
—
—
1.1
The test circuits used for the DC and AC tests are
shown in
capacitors are laid out according to the rules discussed
in Section 4.6 “Supply Bypass”.
FIGURE 1-2:
Most Non-Inverting Gain Conditions.
FIGURE 1-3:
Most Inverting Gain Conditions.
V
V
V
V
DD
DD
Typ
256
230
163
206
120
100
85
70
—
—
IN
IN
/2
/2
Test Circuits
R
R
R
R
N
G
N
G
Figure 1-2
SS
+125
+150
Max
—
—
—
—
—
—
—
—
= GND.
MCP629X
MCP629X
V
V
AC and DC Test Circuit for
AC and DC Test Circuit for
DD
DD
Units
and
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
© 2007 Microchip Technology Inc.
°C
°C
0.1 µF
0.1 µF
R
R
Figure
F
F
Note
1 µF
1 µF
1-2. The bypass
Conditions
C
C
L
L
V
V
L
L
V
R
V
R
OUT
OUT
L
L