AN80L33RMSTX Panasonic - SSG, AN80L33RMSTX Datasheet
AN80L33RMSTX
Specifications of AN80L33RMSTX
Related parts for AN80L33RMSTX
AN80L33RMSTX Summary of contents
Page 1
Voltage Regulators AN80LxxRMS Series Positive output, low dropout voltage regulator (150 mA type) Overview The AN80LxxRMS series is a 0.15 A, low dropout, positive voltage regulator with reset function. 20 classifi- cations of output voltages, 1.8 V, 1.9 V, 2.0 ...
Page 2
AN80LxxRMS Series Output Voltage Characteristics at I Type No. Output V AN80L18RMS 1.8 AN80L19RMS 1.9 AN80L20RMS 2.0 AN80L21RMS 2.1 AN80L22RMS 2.2 AN80L25RMS 2.5 AN80L28RMS 2.8 AN80L29RMS 2.9 AN80L30RMS 3.0 AN80L31RMS 3.1 AN80L32RMS 3.2 AN80L33RMS 3.3 AN80L34RMS 3.4 AN80L35RMS 3.5 AN80L36RMS ...
Page 3
Absolute Maximum Ratings Parameter * 1 Supply voltage Supply current * 3 Power dissipation * 2 Operating ambient temperature * 2 Storage temperature Note There may be a case of the device destruction when the output (V input ...
Page 4
AN80LxxRMS Series Electrical Characteristics at T AN80L18RMS (1.8 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 5
Electrical Characteristics at T AN80L19RMS (1.9 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 6
AN80LxxRMS Series Electrical Characteristics at T AN80L20RMS (2.0 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 7
Electrical Characteristics at T AN80L21RMS (2.1 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 8
AN80LxxRMS Series Electrical Characteristics at T AN80L22RMS (2.2 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 9
Electrical Characteristics at T AN80L25RMS (2.5 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 10
AN80LxxRMS Series Electrical Characteristics at T AN80L28RMS (2.8 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 11
Electrical Characteristics at T AN80L29RMS (2.9 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 12
AN80LxxRMS Series Electrical Characteristics at T AN80L30RMS (3.0 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 13
Electrical Characteristics at T AN80L31RMS (3.1 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 14
AN80LxxRMS Series Electrical Characteristics at T AN80L32RMS (3.2 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 15
Electrical Characteristics at T AN80L33RMS (3.3 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 16
AN80LxxRMS Series Electrical Characteristics at T AN80L34RMS (3.4 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 17
Electrical Characteristics at T AN80L35RMS (3.5 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 18
AN80LxxRMS Series Electrical Characteristics at T AN80L36RMS (3.6 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 19
Electrical Characteristics at T AN80L48RMS (4.8 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 20
AN80LxxRMS Series Electrical Characteristics at T AN80L49RMS (4.9 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 21
Electrical Characteristics at T AN80L50RMS (5.0 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 22
AN80LxxRMS Series Electrical Characteristics at T AN80L51RMS (5.1 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the ...
Page 23
Electrical Characteristics at T AN80L52RMS (5.2 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction ...
Page 24
AN80LxxRMS Series Application Notes curves of MINI-5D package ESR characteristics Test circuit 14.5 V Note) 1. Not guaranteed values. 2. The capacitance value used for C 3. Use a capacitor having ...
Page 25
Application Notes (continued) 3. Output rise-time characteristics V OUT CONT 4. Main characteristics AN80L18RMS V T OUT a 1.89 Input voltage: 2.8 V 1.87 1.85 1. OUT 1.81 I OUT I 150 mA 1.79 OUT 1.77 1.75 ...
Page 26
AN80LxxRMS Series Application Notes (continued) 4. Main characteristics (continued) AN80L33RMS V T OUT a 3.435 Input voltage: 4.3 V 3.385 3.335 OUT 3.285 I 150 mA I OUT OUT 3.235 3.185 3.135 ...
Page 27
Request for your special attention and precautions in using the technical information and semiconductors described in this material (1) An export permit needs to be obtained from the competent authorities of the Japanese Govern- ment if any of the products ...