SPX1587AT-L Exar Corporation, SPX1587AT-L Datasheet

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Product Characterization Report SPX1587 Family of Products SPX1582, SPX1583, SPX1587 Products Prepared By: William Chou, Salvador Wu & Greg West Date: November 8, 2006 for the ...

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Table of Contents Section Introduction Characterization Procedure Data Summary for Key Parameters Conclusions Data Histograms SPX1587 Product Family Characterization Report Appendix A Page Page 11/17/2006 ...

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Introduction: This product family characterization was done as part of the qualification of Sipex’s fabrication site transfer from Sipex’s Hillview Fab in Milpitas, CA contract foundry, Silan, in Hangzhou, China. This characterization report summarizes data for key SPX1587 ...

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Data Summary: Key Parameter Across Temperature Data Summary Units Hillview Fab Key Parameter Distribution Mean -40C 4.0: After Final 2.489 Trim Vref V 6.0: Line 747.98 Regulation uV 10.0: Load Regulation 4.338 mV 12.0: Dropout 1.026 V 14.0: Quiscent_Current 3.156 ...

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... SPX1587AT-1-5 SPX1587AU-L-5-0 SPX1587AT-1-8 SPX1587R SPX1587AT-2-5 SPX1587R-1-5 SPX1587AT-2-8 SPX1587R-1-8 SPX1587AT-2-85 SPX1587R-2-5 SPX1587AT-3-3 SPX1587R-3-3 SPX1587AT-5-0 SPX1587R-5-0 SPX1587AT-L SPX1587R-L SPX1587AT-L-1-5 SPX1587R-L-1-5 SPX1587AT-L-1-8 SPX1587R-L-1-8 SPX1587AT-L-2-5 SPX1587R-L-2-5 SPX1587AT-L-2-8 SPX1587R-L-3-3 SPX1587AT-L-2-85 SPX1587R-L-5-0 SPX1587T SPX1587T-1-5 SPX1587T-1-8 SPX1587T-2-5 SPX1587T-2-8 SPX1587T-2-85 SPX1587T-3-3 SPX1587T-5-0 SPX1587T-L SPX1587T-L-1-5 SPX1587T-L-1-8 SPX1587T-L-2-5 SPX1587T-L-2-8 SPX1587T-L-2-85 SPX1587T-L-3-3 ...

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SPX1587 Product Family Characterization Report This Page Intentionally Left Blank Page 11/17/2006 ...

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Appendix A Characterization Data Histograms SPX1587 Product Family Characterization Report Page 11/17/2006 ...

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COLDHistogram: Test.Number=4.0, Test.Name=After Final Trim Vref Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_COLD MS1612 SPX1587 Statistics: (V) Min 2.471 StatLow Max 2.512 NWithinSpec Mean 2.491 NOutsideSpec StdDev 11.088E-03 90% 25% 2.483 Range Mean+3*StdD NOutsideSpec ...

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COLDHistogram: Test.Number=4.0, Test.Name=After Final Trim Vref Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_cold: MS1612 SPX1587 _ N/A Statistics: (V) Min 2.459 StatLow Max 2.514 NWithinSpec Mean 2.489 NOutsideSpec StdDev 13.450E-03 90% 25% 2.479 Range Mean+3*StdD NOutsideSpec 2.529 ...

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COLDHistogram: Test.Number=6.0, Test.Name=Line Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_COLD MS1612 SPX1587 Statistics: (mV) Min 531.000E-03 StatLow Max 1.208 NWithinSpec Mean 998.573E-03 NOutsideSpec StdDev 150.304E-03 90% 25% 952.100E-03 Range Mean+3*StdD NOutsideSpec 1.449 ev ...

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COLDHistogram: Test.Number=6.0, Test.Name=Line Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_cold: MS1612 SPX1587 _ N/A Statistics: (mV) Min 362.400E-03 StatLow Max 1.119 NWithinSpec Mean 747.982E-03 NOutsideSpec StdDev 171.860E-03 90% 25% 643.600E-03 Range Mean+3*StdD NOutsideSpec 1.264 ev Cp ...

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COLDHistogram: Test.Number=10.0, Test.Name=Load Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_COLD MS1612 SPX1587 Statistics: (mV) Min 2.167 StatLow Max 4.139 NWithinSpec Mean 3.081 NOutsideSpec StdDev 562.942E-03 90% 25% 2.527 Range Mean+3*StdD NOutsideSpec 4.769 ev ...

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COLDHistogram: Test.Number=10.0, Test.Name=Load Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_cold: MS1612 SPX1587 _ N/A Statistics: (mV) Min 1.263 StatLow Max 5.996 NWithinSpec Mean 4.338 NOutsideSpec StdDev 1.033 90% 25% 3.764 Range Mean+3*StdD NOutsideSpec 7.437 ev Cp ...

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COLDHistogram: Test.Number=12.0, Test.Name=Dropout Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_COLD MS1612 SPX1587 Statistics: (V) Min 884.200E-03 StatLow Max 1.006 NWithinSpec Mean 917.812E-03 NOutsideSpec StdDev 29.447E-03 90% 25% 902.300E-03 Range Mean+3*StdD NOutsideSpec 1.006 ev Cp ...

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COLDHistogram: Test.Number=12.0, Test.Name=Dropout Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_cold: MS1612 SPX1587 _ N/A Statistics: (V) Min 956.000E-03 StatLow Max 1.046 NWithinSpec Mean 1.026 NOutsideSpec StdDev 17.654E-03 90% 25% 1.020 Range Mean+3*StdD NOutsideSpec 1.079 ev Cp Mean- ...

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COLDHistogram: Test.Number=14.0, Test.Name=Quiescent_Current Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_COLD MS1612 SPX1587 Statistics: (mA) Min 2.208 StatLow Max 3.290 NWithinSpec Mean 2.841 NOutsideSpec StdDev 232.162E-03 90% 25% 2.666 Range Mean+3*StdD NOutsideSpec 3.538 ev Cp ...

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COLDHistogram: Test.Number=14.0, Test.Name=Quiescent_Current Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_cold: MS1612 SPX1587 _ N/A Statistics: (mA) Min 2.029 StatLow Max 3.576 NWithinSpec Mean 3.156 NOutsideSpec StdDev 289.008E-03 90% 25% 3.025 Range Mean+3*StdD NOutsideSpec 4.023 ev Cp Mean- ...

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ROOMHistogram: Test.Number=4.0, Test.Name=After Final Trim Vref Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_ROO MS1612 SPX1587 Statistics: (V) Min 2.480 StatLow Max 2.510 NWithinSpec Mean 2.496 NOutsideSpec StdDev 8.854E-03 90% 25% 2.488 Range Mean+3*StdD NOutsideSpec ...

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ROOMHistogram: Test.Number=4.0, Test.Name=After Final Trim Vref Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_ROO MS1612 SPX1587 Statistics: (V) Min 2.481 StatLow Max 2.516 NWithinSpec Mean 2.498 NOutsideSpec StdDev 9.874E-03 90% 25% 2.490 Range Mean+3*StdD NOutsideSpec ...

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ROOMHistogram: Test.Number=6.0, Test.Name=Line Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_ROO MS1612 SPX1587 Statistics: (mV) Min 628.700E-03 StatLow Max 1.184 NWithinSpec Mean 1.030 NOutsideSpec StdDev 126.812E-03 90% 25% 952.100E-03 Range Mean+3*StdD NOutsideSpec 1.410 ev ...

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ROOMHistogram: Test.Number=6.0, Test.Name=Line Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_ROO MS1612 SPX1587 Statistics: (mV) Min 262.500E-03 StatLow Max 1.125 NWithinSpec Mean 700.836E-03 NOutsideSpec StdDev 244.841E-03 90% 25% 512.400E-03 Range Mean+3*StdD NOutsideSpec 1.435 ev ...

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ROOMHistogram: Test.Number=10.0, Test.Name=Load Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_ROO MS1612 SPX1587 Statistics: (mV) Min 2.111 StatLow Max 4.194 NWithinSpec Mean 3.051 NOutsideSpec StdDev 683.762E-03 90% 25% 2.472 Range Mean+3*StdD NOutsideSpec 5.102 ev ...

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ROOMHistogram: Test.Number=10.0, Test.Name=Load Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_ROO MS1612 SPX1587 Statistics: (mV) Min 1.035 StatLow Max 6.300 NWithinSpec Mean 3.626 NOutsideSpec StdDev 1.526 90% 25% 2.881 Range Mean+3*StdD NOutsideSpec 8.203 ev ...

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ROOMHistogram: Test.Number=12.0, Test.Name=Dropout Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_ROO MS1612 SPX1587 Statistics: (V) Min 888.900E-03 StatLow Max 995.800E-03 NWithinSpec Mean 912.668E-03 NOutsideSpec StdDev 21.503E-03 90% 25% 901.400E-03 Range Mean+3*StdD NOutsideSpec 977.177E- ...

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ROOMHistogram: Test.Number=12.0, Test.Name=Dropout Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_ROO MS1612 SPX1587 Statistics: (V) Min 944.600E-03 StatLow Max 1.040 NWithinSpec Mean 1.022 NOutsideSpec StdDev 16.734E-03 90% 25% 1.020 Range Mean+3*StdD NOutsideSpec 1.072 ev Cp ...

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ROOMHistogram: Test.Number=14.0, Test.Name=Quiescent_Current Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_ROO MS1612 SPX1587 Statistics: (mA) Min 3.453 StatLow Max 3.788 NWithinSpec Mean 3.665 NOutsideSpec StdDev 62.521E-03 90% 25% 3.629 Range Mean+3*StdD NOutsideSpec 3.853 ev Cp ...

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ROOMHistogram: Test.Number=14.0, Test.Name=Quiescent_Current Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_ROO MS1612 SPX1587 Statistics: (mA) Min 3.892 StatLow Max 4.018 NWithinSpec Mean 3.953 NOutsideSpec StdDev 35.929E-03 90% 25% 3.921 Range Mean+3*StdD NOutsideSpec 4.061 ev Cp ...

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HOTHistogram: Test.Number=4.0, Test.Name=After Final Trim Vref Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_HOT: MS1612 SPX1587 _ 01 Statistics: (V) Min 2.481 StatLow Max 2.510 NWithinSpec Mean 2.496 NOutsideSpec StdDev 8.908E-03 90% 25% 2.488 Range Mean+3*StdD NOutsideSpec 2.523 ...

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HOTHistogram: Test.Number=4.0, Test.Name=After Final Trim Vref Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_HOT: MS1612 SPX1587 _ 01 Statistics: (V) Min 2.487 StatLow Max 2.517 NWithinSpec Mean 2.499 NOutsideSpec StdDev 8.415E-03 90% 25% 2.493 Range Mean+3*StdD NOutsideSpec 2.525 ...

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HOTHistogram: Test.Number=6.0, Test.Name=Line Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_HOT: MS1612 SPX1587 _ 01 Statistics: (mV) Min 836.200E-03 StatLow Max 1.575 NWithinSpec Mean 1.258 NOutsideSpec StdDev 176.994E-03 90% 25% 1.172 Range Mean+3*StdD NOutsideSpec 1.789 ev Cp ...

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HOTHistogram: Test.Number=6.0, Test.Name=Line Regulation Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_HOT: MS1612 SPX1587 _ 01 Statistics: (mV) Min 437.400E-03 StatLow Max 1.237 NWithinSpec Mean 839.633E-03 NOutsideSpec StdDev 187.697E-03 90% 25% 706.100E-03 Range Mean+3*StdD NOutsideSpec 1.403 ev Cp ...

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HOTHistogram: Test.Number=12.0, Test.Name=Dropout Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1612_HOT: MS1612 SPX1587 _ 01 Statistics: (V) Min 911.000E-03 StatLow Max 1.129 NWithinSpec Mean 1.026 NOutsideSpec StdDev 55.942E-03 90% 25% 986.000E-03 Range Mean+3*StdD NOutsideSpec 1.193 ev Cp Mean- ...

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HOTHistogram: Test.Number=12.0, Test.Name=Dropout Lot: Wafers Maskset Device Device Rev Operation Foundry ID 1400_HOT: MS1612 SPX1587 _ 01 Statistics: (V) Min 918.400E-03 StatLow Max 1.181 NWithinSpec Mean 988.172E-03 NOutsideSpec StdDev 64.192E-03 90% 25% 928.500E-03 Range Mean+3*StdD NOutsideSpec 1.181 ev Cp Mean- ...