ATMEGA256RZAV-8AU Atmel, ATMEGA256RZAV-8AU Datasheet - Page 30

MCU ATMEGA2561/AT86RF230 64-TQFP

ATMEGA256RZAV-8AU

Manufacturer Part Number
ATMEGA256RZAV-8AU
Description
MCU ATMEGA2561/AT86RF230 64-TQFP
Manufacturer
Atmel
Series
ATMEGAr
Datasheets

Specifications of ATMEGA256RZAV-8AU

Frequency
2.4GHz
Modulation Or Protocol
802.15.4 Zigbee
Applications
ISM, ZigBee™
Power - Output
3dBm
Sensitivity
-101dBm
Voltage - Supply
1.8 V ~ 3.6 V
Current - Receiving
15.5mA
Current - Transmitting
16.5mA
Data Interface
PCB, Surface Mount
Memory Size
256kB Flash, 4kB EEPROM, 8kB RAM
Antenna Connector
PCB, Surface Mount
Package / Case
64-TQFP
Wireless Frequency
2.4 GHz
Interface Type
JTAG, SPI
Output Power
3 dBm
For Use With
ATAVRISP2 - PROGRAMMER AVR IN SYSTEM
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Operating Temperature
-
Data Rate - Maximum
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
For Use With/related Products
ATmega256
10.4
10.5
10.6
10.7
10.8
2549MS–AVR–09/10
ATmega2560 rev. E
ATmega2560 rev. D
ATmega2560 rev. C
ATmega2560 rev. B
ATmega2560 rev. A
2. High current consumption in sleep mode
1. High current consumption in sleep mode
1.
2. Part does not work under 2.4 volts
High current consumption in sleep mode.
Non-Read-While-Write area of flash not functional.
Part does not work under 2.4 volts.
Incorrect ADC reading in differential mode.
Internal ADC reference has too low value.
IN/OUT instructions may be executed twice when Stack is in external RAM.
EEPROM read from application code does not work in Lock Bit Mode 3.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
No known errata.
Not sampled.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
Not sampled.
The Non-Read-While-Write area of the flash is not working as expected. The problem is
related to the speed of the part when reading the flash of this area.
Problem Fix/Workaround
- Only use the first 248K of the flash.
- If boot functionality is needed, run the code in the Non-Read-While-Write area at maximum
1/4th of the maximum frequency of the device at any given voltage. This is done by writing
the CLKPR register before entering the boot section of the code.
The part does not execute code correctly below 2.4 volts.
Non-Read-While-Write area of flash not functional
ATmega640/1280/1281/2560/2561
30

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