RN-800S-CB Roving Networks Inc, RN-800S-CB Datasheet
RN-800S-CB
Specifications of RN-800S-CB
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RN-800S-CB Summary of contents
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... COM V REF Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty ...
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... Serial Data Input LOW, data is latched on rising edge CLK Chip Select Input. Active LOW. Data will not be clocked into D unless CS is LOW. When CS is HIGH OUT high impedance. External Clock Input. The clock speed determines the conversion rate by the equation • f DCLK SAMPLE Power Supply. ADS8344 SBAS139B is . ...
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... Power-Supply Rejection +4.75V < V SAMPLING DYNAMICS Conversion Time Acquisition Time Throughput Rate Multiplexer Settling Time Aperture Delay Aperture Jitter Internal Clock Frequency External Clock Frequency Data Transfer Only DYNAMIC CHARACTERISTICS (2) Total Harmonic Distortion V Signal-to-(Noise + Distortion) V Spurious Free Dynamic Range V Channel-to-Channel Isolation ...
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... V SAMPLING DYNAMICS Conversion Time Acquisition Time Throughput Rate Multiplexer Settling Time Aperture Delay Aperture Jitter Internal Clock Frequency External Clock Frequency When used with Internal Clock Data Transfer Only DYNAMIC CHARACTERISTICS (2) Total Harmonic Distortion V IN Signal-to-(Noise + Distortion Spurious Free Dynamic Range ...
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TYPICAL CHARACTERISTICS +5V +5V REF SAMPLE FREQUENCY SPECTRUM (4096 Point FFT 1.001kHz, –0.2dB –20 –40 –60 –80 –100 –120 –140 –160 0 10 ...
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TYPICAL CHARACTERISTICS +5V +5V REF SAMPLE INTEGRAL LINEARITY ERROR vs CODE –1 –2 –3 –4 0000 4000 8000 Output Code 6 ...
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TYPICAL CHARACTERISTICS: +2. + +2.7V +2.7V REF SAMPLE FREQUENCY SPECTRUM (4096 Point FFT 1.001kHz, –0.2dB –20 –40 –60 –80 –100 –120 –140 –160 0 10 ...
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TYPICAL CHARACTERISTICS: +2. + +2.7V +2.7V REF SAMPLE INTEGRAL LINEARITY ERROR vs CODE –1 –2 –3 0000 4000 8000 Output Code 8 ...
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... When the converter enters the hold mode, the voltage difference between the +IN and –IN inputs is captured on the internal capacitor array (see Figure 2). The voltage on the –IN input is limited between –0.2V and 1.25V, allowing the input to reject small signals which are common to both the +IN and – ...
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... Likewise, the noise or uncertainty of the digitized output will increase with lower LSB size. With a reference voltage of 500mV, the LSB size is 7.6 V. This level is below the +IN internal noise of the device result, the digital output Converter code will not be stable and will vary around a mean value by –IN a number of LSBs ...
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... TABLE V. Power-Down Selection. Clock Modes The ADS8344 can be used with an external serial clock or an internal clock to perform the successive-approximation con- version. In both clock modes, the external clock shifts data in BIT 0 BIT 2 BIT 1 (LSB) and out of the device. Internal clock mode is selected when PD1 is HIGH and PD0 is LOW ...
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... HIGH when the conversion is complete. During the conversion, BUSY will remain LOW for a maximum Also, during the conversion, DCLK should remain LOW to achieve the best noise performance. The conversion result is stored in an internal register; the data may be clocked out of this register any time after the conversion is complete ...
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... The digital output of the A/D converter will vary in output code due to the internal noise of the ADS8344. This is true for all 16-bit SAR-type A/D converters. Using a histogram to plot the output codes, the distribution should appear bell-shaped with the peak of the bell curve representing the nominal code for the input value ...
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... The degree of error in the digital output depends on the reference voltage, layout, and the exact timing of the external event. The error can change if the external event changes in time with respect to the DCLK input. ...
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... TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards ...