CTK019 3M, CTK019 Datasheet - Page 2

• Manufacturer Part Number: CTK019
• Description: SCANEM-QC EMC NEAR-FIELD PROBE
• Manufacturer: 3M
• Series: ScanEM® Probesr
• Type: Prober

Specifications of CTK019

• Power Supply Type: AAA Batteries (2)
• Description/function: ScanEM-QC Near-Field Probes
• For Use With/related Products: Electromagnetic Emission
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Features: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 51111162064; 80000919573; SCP256; XA004143278

Connectivity
…to a spectrum analyzer
Equip your spectrum analyzer with ScanEM probes
and open its eyes to signals it has never seen be-
fore. Each ScanEM probe covers the entire EMC
bandwidth, and has a broadband amplifier built in.
Due to its high spatial resolution, ScanEM-C can pin-
point a source of emission down
to a trace or component.
Traditional passive probes
have little or no output at
the lower end of the spectrum,
where most fundamental
frequencies are. Compare
the frequency response of
ScanEM probes versus their
passive counterparts on the
screen shot shown. ScanEM
probes have a flat frequency
response across the entire
bandwidth.
…to an oscilloscope
Connected to an oscillo-
scope, ScanEM-C lets you
see signals without affect-
ing the circuit in any way.
The screenshot shows how
a conventional 1GHz FET
probe (bottom trace)
missed signal artifacts that
ScanEM-EC was able to
show (top trace).
ScanEM-EC, an electric
field probe, shows
the voltage on traces.
ScanEM-HC, a magnetic
field probe, shows AC
currents up to 1GHz on
traces and ground planes. Catch those elusive
high-speed transients with ScanEM-C probes!
As a non-contact field probe, ScanEM-C output
depends on the proximity to the source, and on
possible strong emissions from adjacent sources.
…to a multimeter
ScanEM probes provide DC output as a function of
field strength. Connect a ScanEM probe to any multi-
meter set to Volts DC and monitor field strength with
no additional equipment.
www.credencetech.com
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-60
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-80
0MHz
Frequency response
of ScanEM-EC vs.
passive probes.
High-speed signal as
seen by ScanEM-EC
(top) and FET probe
(bottom).
Each division is
125MHz
Stub probe
ScanEM-EC
Ball probe
1250MHz
ScanEM
Why Near-Field?
The standard radiated EMC test is done in the far field, 10’ (3m) from the product.
This test tells if the product fails, but cannot point to the source of the problem. It is
similar to identifying from a distance what makes a noise under the hood of a car—
you can guess that it is a belt, but which one? And perhaps it’s not a belt at all.
To find the source of the problem, why not come closer? As with a car, electronic
assemblies also need a “close up” inspection. The right tool for the job is called a
near-field probe. With ScanEM near-field probes, the entire product can be quickly
scanned, and leaks and problem areas can be identified and characterized.
EMC Diagnostics
of PC Boards
Use ScanEM probes to shorten
your project schedule by eliminat-
ing the “EMC surprise factor.”
Lower product cost and antici-
pate EMC problems early in
the design, rather than react-
ing to them later, with tools
that are useful at any phase
of product design.
ScanEM-C probes can pin-
point emission sources down
to a single pin or trace on a
PC board. Providing separate
indication for electric (E) and
magnetic (H) fields, each
ScanEM probe covers the
entire frequency range of EMC
compliance requirements.
ScanEM allows for easy identifi-
cation of emission problems
early in your design, and for
instant verification of design
changes on the spot.
®
—a little probe that is many things in one
EMC in Production
and QA
Now that you have designed a
product that complies with the
FCC, CE, etc., you can sleep
well knowing that your com-
pany is shipping only compliant
products. Or can you?
A loose screw, misplaced
shielding, an absent ferrite
clamp, paint covering the
ground connections of an
enclosure—any of these mis-
haps and more can put you in
violation of FCC or CE rules.
ScanEM-Q/QC probes provide
a quick and reliable way to
test each production unit for
electromagnetic compliance in
seconds and with minimal skills.
Test each product the way the
FCC does—their agents use
ScanEM probes to catch emis-
sion violators in the field.
Service and
Repair
Circuit boards are getting more
and more complex. It is impos-
sible for a repair technician to
fully understand the operation of
the numerous circuits that he has
to service on a component level.
The result is an increasing cost
of repair and a high ratio of
rejected boards.
Each component, especially
each IC, generates a specific
pattern of electromagnetic emis-
sion that changes when this
component is malfunctioning.
ScanEM probes can help char-
acterize emission patterns and
identify defective components
and traces, even in the most
complex of circuits.
What about ESD Events and EMI?
Electromagnetic interference (EMI) and electrostatic discharges (ESD Events) can lead to
yield losses, malfunction of electronic equipment, and component damage.
EMI invades your product via radiated (air) and conducted (cables) emission. ScanEM
probes can easily identify the presence of EMI and ESD Events, characterize them, and
trace them to their sources.
Use ScanEM-EQC for a radiated electric field, and ScanEM-HQC for conducted
emission, including ground wires. For EMI diagnostics, use ScanEM with a spectrum
analyzer. For ESD Event analysis, connect ScanEM to a high-speed oscilloscope.
Signal Integrity
Diagnostics
High-speed digital circuits
often exhibit such problems as
ringing, overshoots, under-
shoots, ground bounce, and a
number of other non-digital arti-
facts. Conventional oscilloscope
probes load the circuit and alter
signal behavior, making it diffi-
cult to diagnose these problems.
In fact, often a circuit works
only when a probe is attached
to it.
As non-contact instruments,
ScanEM probes do not load
the circuit, and have a very
wide frequency bandwidth.
ScanEM can reveal signal in-
tegrity problems that even the
most sophisticated conventional
probes miss. ScanEM-C probes
will show you the waveform of
voltages and currents in traces
and ground planes.
Use ScanEM to
find remaining
problems with EMC
ScanEM as Part of the
EMC Process
Use ScanEM to
locate hot emission
spots. Provide
input to PCB
Designer.
Verify Improvements
Small modifications,
if needed
Regular production
QA EMC check to
spot process-
dependent EMC
problems
A day spent at the beginning of the project
preventing EMC problems saves a month of
fixing these problems at the end.
Finalize PCB
Design
Pre-Production
Check of Every
First Prototype
Modifications
Shipped Unit
Certification
On-Going
Prototype
QA EMC
Passed
Minor
Start
EMC
Test
for Shielding
Design with
Mechanical
Finalize
Provision
Use ScanEM to
estimate EMI
shielding needs.
Provide input to
Mechanical
Engineering.
ScanEM
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