SCAN921023SLCX National Semiconductor, SCAN921023SLCX Datasheet - Page 4

• Manufacturer Part Number: SCAN921023SLCX
• Description: IC SERIALIZER 10BIT 49-FBGA
• Manufacturer: National Semiconductor
• Series: SCANr

Specifications of SCAN921023SLCX

• Function: Serializer
• Data Rate: 660Mbps
• Input Type: LVDS
• Output Type: LVDS
• Number Of Inputs: 10
• Number Of Outputs: 1
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 49-FBGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

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TRI-STATE
TRI-STATE. When you drive DEN high, the Serializer returns
to the previous state, as long as all other control pins remain
static (SYNC1, SYNC2, PWRDN, TCLK_R/F).
When you drive the REN pin low, the Deserializer enters
TRI-STATE.
(ROUT0–ROUT9) and RCLK will enter TRI-STATE. The
LOCK output remains active, reflecting the state of the PLL.
1) Difference in lock times are due to different starting points in the data
pattern with multiple parts.
Test Modes
In addition to the IEEE 1149.1 test access to the digital TTL
pins, the SCAN921023 and SCAN921224 have two instruc-
Conditions:
Maximum
Minimum
Random Lock Times for the SCAN921224
Mean
Consequently,
(Continued)
PRBS 2
TABLE 1.
66 MHz
0.43
the
3.0
18
15
, V
receiver
CC
= 3.3V
output
Units
µS
µS
µS
pins
4
tions to test the LVDS interconnects. The first is EXTEST.
This is implemented at LVDS levels and is only intended as
a go no-go test (e.g. missing cables). The second method is
the RUNBIST instruction. It is an "at-system-speed" inter-
connect test. It is executed in approximately 33mS with a
system clock speed of 66MHz. There are two bits in the RX
BIST data register for notification of PASS/FAIL and
TEST_COMPLETE. Pass indicates that the BER (Bit-Error-
Rate) is better than 10
An important detail is that once both devices have the RUN-
BIST instruction loaded into their respective instruction reg-
isters, both devices must move into the RTI state within 4K
system clocks (At a SCLK of 66Mhz and TCK of 1MHz this
allows for 66 TCK cycles). This is not a concern when both
devices are on the same scan chain or LSP, however, it can
be a problem with some multi-drop devices. This test mode
has been simulated and verified using National’s SCAN-
STA111.
Ordering Information
NSID
SCAN921023SLC
SCAN921224SLC
-7
.
Deserializer
Function
Serializer
Package
SLC49a
SLC49a