GRM1885C1H1R5BZ01D Murata Electronics North America, GRM1885C1H1R5BZ01D Datasheet - Page 134
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GRM1885C1H1R5BZ01D
Manufacturer Part Number
GRM1885C1H1R5BZ01D
Description
CAP CER 1.5PF 50V C0G 0603
Manufacturer
Murata Electronics North America
Series
GRMr
Datasheet
1.GNM1M2R71C104MA03D.pdf
(220 pages)
Specifications of GRM1885C1H1R5BZ01D
Voltage - Rated
50V
Lead Style
*
Capacitance
1.5pF
Tolerance
±0.1pF
Temperature Coefficient
C0G, NP0
Mounting Type
*
Operating Temperature
-55°C ~ 125°C
Applications
General Purpose
Package / Case
*
Size / Dimension
*
Thickness
*
Lead Spacing
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Ratings
-
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!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
132
No.
10
11
12
Mounting for testing : The capacitors should be mounted on the substrate as shown below using die bonding. when tests No.11 to 15 are performed.
GMD Series Specifications and Test Methods (1)
GMD Series Specifications and Test Methods (1)
1
2
3
4
5
6
7
8
9
Operating
Temperature
Range
Rated Voltage
Appearance
Dimensions
Dielectric Strength
Insulation
Resistance
Capacitance
Dissipation
Factor (D.F.)
Capacitance
Temperature
Characteristics
Mechanical
Strength
Vibration
Resistance
Temperature
Cycle
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
No bias
Bond
Strength
Die Shear
Strength
Appearance No defects or abnormalities.
Capacitance Within the specified tolerance.
D.F.
Appearance No defects or abnormalities.
Capacitance
Change
D.F.
I.R.
Dielectric
Strength
R7 : –55 C to 125 C
See the previous pages.
No defects or abnormalities.
Within the specified dimensions.
No defects or abnormality.
More than 10,000M or 500 · F
(Whichever is smaller)
Within the specified tolerance.
R7 :
W.V. 25Vmin. : 0.025 max.
W.V. 16/10V : 0.035 max.
R7 : Within 15% (–55 C to +125 C)
Pull force : 0.03N min.
Die Shear force : 2N min.
R7 :
W.V. 25Vmin. : 0.025 max.
W.V. 16/10V : 0.035 max.
R7 : Within 7.5%
R7 :
W.V. 25Vmin. : 0.025 max.
W.V. 16/10V : 0.035 max.
More than 10,000M or 500 · F
(Whichever is smaller)
No defects
In case Non "*" is added in PNs table, please refer to GMD Series Specifications and Test Methods (1).
Specifications
In case "*" is added in PNs table, please refer to GMD Series Specifications and Test Methods (2).
Reference Temperature : 25 C
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
whichever is larger, should be maintained within the rated volt-
age range.
Visual inspection.
Using calipers.
No failure should be observed when 250% of the rated voltage
is applied between the terminations for 1 to 5 seconds, provid-
ed the charge/discharge current is less than 50mA.
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at normal temperature
and humidity and within 2 minutes of charging.
The capacitance/D.F. should be measured at reference
temperature at the frequency and voltage shown in the table.
The capacitance change should be measured after 5min. at
each specified temp. stage.
The ranges of capacitance change compared with the
Reference Temperature value over the temperature ranges
shown in the table should be within the specified ranges.*
*Initial measurement for high dielectric constant type
Perform a heat treatment at 150 +0/–10 C for one hour and
then let sit for 24 2 hours at room temperature.
Perform the initial measurement.
MIL-STD-883 Method 2011 Condition D
Mount the capacitor on a gold metallized alumina substrate with
Au-Sn (80/20) and bond a 25mm (0.001 inch) gold wire to the
capacitor terminal using an ultrasonic ball bond. Then, pull wire.
MIL-STD-883 Method 2019
Mount the capacitor on a gold metallized alumina substrate
with Au-Sn (80/20). Apply the force parallel to the substrate.
Ramp frequency from 10 to 55Hz then return to 10Hz all within
1 minute. Amplitude : 1.5 mm (0.06 inch) max. total excursion.
Apply this motion for a period of 2 hours in each of 3 mutually
perpendicular directions (total 6 hours).
The capacitor should be set for 24 2 hours at room
temperature after one hour heat of treatment at 150+0/–10 C,
then measure for the initial measurement. Fix the capacitor to
the supporting jig in the same manner and under the same
conditions as (11) and conduct the five cycles according to the
temperatures and time shown in the following table. Set it for
24 2 hours at room temperature, then measure.
Temp. ( C)
Time (min.)
Frequency
Voltage
Step
Step
1
2
3
4
Temp.+0/–3
Operating
30+/–3
Min.
1
Test Method
Temperature ( C)
Temp.
Room
2 to 3
Continued on the following page.
2
–55 3
125 3
1 0.2Vrms
25 2
25 2
1 0.1kHz
Temp. +3/–0
Operating
30+/–3
Max.
3
P-P
Temp.
Room
2 to 3
or V
4
O-P
,
C02E.pdf
09.9.18
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