DEBF33D102ZP2A Murata Electronics North America, DEBF33D102ZP2A Datasheet - Page 50

• Manufacturer Part Number: DEBF33D102ZP2A
• Description: CAP CER 1000PF 2000VDC F RAD
• Manufacturer: Murata Electronics North America
• Series: DEBr

Specifications of DEBF33D102ZP2A

• Voltage - Rated: 2000V (2kV)
• Lead Style: *
• Capacitance: 1000pF
• Tolerance: -20%, +80%
• Temperature Coefficient: F
• Mounting Type: *
• Operating Temperature: -25°C ~ 85°C
• Features: High Voltage
• Applications: General Purpose
• Package / Case: *
• Size / Dimension: *
• Thickness: *
• Lead Spacing: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Ratings: -

9
!Note
48
No.
13
14
15
16
17 Life
* "Room condition" Temperature: 15 to 35°C, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
DEB Series (Class2 / DC1kV-3.15kV) Specifications and Test Methods
DEB Series Specifications and Test Methods
Continued from the preceding page.
Soldering Effect
(On-Preheat)
Temperature
and Immersion
Cycle
Humidity (Under
Steady State)
Humidity
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• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please review our product specifications or consult the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
Dielectric Strength
(Between Lead
Wires)
Appearance
Capacitance
Change
D.F.
I.R.
Dielectric Strength
(Between Lead
Wires)
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
No marked defect
Char. B: Within ±5%
Char. E: Within ±15%
Char. F: Within ±20%
Per item 4.
No marked defect
Char. B: Within ±10%
Char. E: Within ±20%
Char. F: Within ±30%
Char. B, E: 4.0% max.
Char. F: 7.5% max.
2000MΩ min.
Per item 4.
No marked defect
Char. B: Within ±10%
Char. E: Within ±20%
Char. F: Within ±30%
Char. B, E: 5.0% max.
Char. F: 7.5% max.
1000MΩ min.
No marked defect
Char. B: Within ±10%
Char. E: Within ±20%
Char. F: Within ±30%
Char. B, E: 5.0% max.
Char. F: 7.5% max.
500MΩ min.
No marked defect
Char. B: Within ±10%
Char. E: Within ±20%
Char. F: Within ±30%
Char. B, E: 4.0% max.
Char. F: 7.5% max.
2000MΩ min.
Specifications
First the capacitor should be
stored at 120+0/-5°C for
60+0/-5 sec.
Then, as in the figure, the lead
wires should be immersed in
solder of 260+0/-5°C up to 1.5 to
2.0mm from the root of terminal
for 7.5+0/-1 sec.
Pre-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Post-treatment: Capacitor should be stored for 4 to 24 hrs. at
The capacitor should be subjected to 5 temperature cycles,
then consecutively to 2 immersion cycles.
<Temperature Cycle>
<Immersion Cycle>
Pre-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Post-treatment: Capacitor should be stored for 4 to 24 hrs. at
Set the capacitor for 500+24/-0 hrs. at 40±2°C in 90 to 95%
relative humidity.
Pre-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Post-treatment: Capacitor should be stored for 1 to 2 hrs. at
Apply the rated voltage for 500+24/-0 hrs. at 40±2°C in 90 to
95% relative humidity. (Charge/Discharge currentV50mA)
Pre-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Post-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Apply a DC voltage of 150% of the rated voltage for
1000+48/-0 hrs. at 85±2°C with a relative humidity of 50% max.
(Charge/Discharge currentV50mA)
Pre-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Post-treatment: Capacitor should be stored at 85±2°C for 1 hr.,
Step
1
2
Temperature (°C)
then placed at room condition* for 24±2 hrs.
before initial measurements.
then placed at room condition* for 24±2 hrs.
before initial measurements.
then placed at room condition* for 24±2 hrs.
before initial measurements.
then placed at room condition* for 24±2 hrs.
before initial measurements.
then placed at room condition* for 24±2 hrs.
before initial measurements.
Step
room condition.*
room condition.*
room condition.*
then placed at room condition* for 24±2 hrs.
then placed at room condition* for 24±2 hrs.
65+5/-0
1
2
3
4
0±3
Temperature (°C)
Test Method
Room Temp.
Room Temp.
-25±3
85±3
Time (min)
15
15
Cycle time: 5 cycles
Cycle time : 2 cycles
Thermal
Screen
Immersion Water
Time (min)
Clean water
Salt water
30
30
3
3
Capacitor
Molten
Solder
1.5
to 2.0mm
C85E.pdf
Jul.13,2011