ACMD-7403-BLK Avago Technologies US Inc., ACMD-7403-BLK Datasheet - Page 3

• Manufacturer Part Number: ACMD-7403-BLK
• Description: Duplexer, FBAR, US PCS
• Manufacturer: Avago Technologies US Inc.
• Series: -r

Specifications of ACMD-7403-BLK

• Frequency Bands (low / High): 1.85GHz ~ 1.9GHz / 1.93GHz ~ 1.99GHz
• Low Band Attenuation (min / Max Db): 52.00dB / -
• High Band Attenuation (min / Max Db): 40dB / -
• Return Loss (low Band / High Band): 17dB / 16dB
• Mounting Type: Surface Mount
• Package / Case: 3-CSP
• Screening Level: Commercial
• Lead Free Status / Rohs Status: Contains lead / RoHS non-compliant

ACMD-7403
Absolute Maximum Ratings
Maximum Recommended Operating Conditions
Notes:
1. Operation in excess of any one of these conditions may result in
2. The device will function over the recommended range without
3. T
Figure 1. ACP Probe Test Circuit.

Parameter
Storage temperature
Maximum RF Input Power to Tx Port
Parameter
Operating temperature, T
Tx Power ≤ 29 dBm
Operating temperature, T
Tx Power ≤ 30 dBm
permanent damage to the device.
degradation in reliability or permanent change in performance, but
is not guaranteed to meet electrical specifications.
of the duplexer where it makes contact with the circuit board.
C
is defined as case temperature, the temperature of the underside
c
c
[3]
[3]
[1]
,
,
Unit
°C
dBm +33
Unit Value
°C
°C
[2]
Value
–65 to +125
–40 to +100
–40 to +85
Characterization
A test circuit similar to the one shown in Figure 1 was
used to measure typical device performance. This circuit
is designed to interface with Air Coplanar (ACP), Ground-
Signal-Ground (GSG) RF probes of the type commonly
used to test semiconductor wafers.The PCB test circuit
uses multiple vias to create a well-grounded pad to
which the device under test (DUT) is solder-attached.
Short lengths of 50-ohm microstripline connect the DUT
to ACP probe patterns on the board.
A test circuit with ACMD-7403 mounted in place is shown
in Figure 2. S-parameters are then measured using a
network analyzer and calibrated ACP probe set.
Phase data for s-parameters measured with ACP probe
circuits are adjusted to place the reference plane at the
edge of the duplexer.
Figure 2. Test Circuit with Duplexer.