AD9269-40EBZ Analog Devices Inc, AD9269-40EBZ Datasheet - Page 22

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AD9269-40EBZ

Manufacturer Part Number
AD9269-40EBZ
Description
A/D Converter Eval. Board
Manufacturer
Analog Devices Inc
Datasheets

Specifications of AD9269-40EBZ

Silicon Manufacturer
Analog Devices
Application Sub Type
ADC
Kit Application Type
Data Converter
Silicon Core Number
AD9269
Kit Contents
Software, Evaluation Board
Number Of Adc's
2
Number Of Bits
16
Sampling Rate (per Second)
40M
Data Interface
Serial, SPI™
Inputs Per Adc
1 Differential
Input Range
2 Vpp
Power (typ) @ Conditions
136.3mW @ 40MSPS
Voltage Supply Source
Analog and Digital
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
AD9269
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD9269
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or to improve thermal drift
characteristics. Figure 47 shows the typical drift characteristics
of the internal reference in 1.0 V mode.
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
7.5 kΩ load (see Figure 32). The internal buffer generates the
positive and negative full-scale references for the ADC core.
Therefore, the external reference must be limited to a maximum
of 1.0 V.
CLOCK INPUT CONSIDERATIONS
For optimum performance, clock the AD9269 sample clock
inputs, CLK+ and CLK−, with a differential signal. The signal
is typically ac-coupled into the CLK+ and CLK− pins via a
transformer or capacitors. These pins are biased internally
(see Figure 48) and require no external bias.
–1
–2
–3
–4
–5
–6
CLK+
4
3
2
1
0
–40
Figure 48. Equivalent Clock Input Circuit
–20
2pF
Figure 47. Typical V
0
V
REF
TEMPERATURE (°C)
AVDD
ERROR (mV)
0.9V
20
REF
Drift
40
60
2pF
CLK–
80
Rev. 0 | Page 22 of 40
Clock Input Options
The AD9269 has a very flexible clock input structure. The clock
input can be a CMOS, LVDS, LVPECL, or sine wave signal.
Regardless of the type of signal being used, clock source jitter
is of the most concern, as described in the Jitter Considerations
section.
Figure 49 and Figure 50 show two preferred methods for clock-
ing the AD9269 (at rates up to 6× the specified sample rate when
using the internal clock divider function). A low jitter clock source
is converted from a single-ended signal to a differential signal
using either an RF balun or an RF transformer.
The RF balun configuration is recommended for clock frequencies
between 125 MHz and 480 MHz, and the RF transformer is recom-
mended for clock frequencies from 10 MHz to 200 MHz. The
back-to-back Schottky diodes across the transformer/balun
secondary limit clock excursions into the AD9269 to approxi-
mately 0.8 V p-p differential.
This limit helps prevent the large voltage swings of the clock
from feeding through to other portions of the AD9269 while pre-
serving the fast rise and fall times of the signal that are critical to
a low jitter performance.
CLOCK
INPUT
CLOCK
INPUT
Figure 50. Transformer-Coupled Differential Clock (Up to 200 MHz)
Figure 49. Balun-Coupled Differential Clock (Up to 480 MHz)
50Ω
0.1µF
50Ω
1nF
1nF
100Ω
ADT1-1WT, 1:1 Z
Mini-Circuits
XFMR
0.1µF
®
0.1µF
0.1µF
0.1µF
0.1µF
SCHOTTKY
HSMS2822
SCHOTTKY
HSMS2822
DIODES:
DIODES:
CLK+
CLK–
CLK+
CLK–
ADC
ADC

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