GCM21B5C1H223JA16L Murata, GCM21B5C1H223JA16L Datasheet - Page 51
![](/photos/30/39/303926/grm_sml.jpg)
GCM21B5C1H223JA16L
Manufacturer Part Number
GCM21B5C1H223JA16L
Description
Manufacturer
Murata
Datasheet
1.GCM21B5C1H223JA16L.pdf
(66 pages)
Specifications of GCM21B5C1H223JA16L
Tolerance (+ Or -)
5%
Voltage
50VDC
Temp Coeff (dielectric)
C0G
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Construction
SMT Chip
Case Style
Ceramic Chip
Failure Rate
Not Required
Wire Form
Not Required
Product Length (mm)
2mm
Product Depth (mm)
1.25mm
Product Height (mm)
1.25mm
Product Diameter (mm)
Not Requiredmm
Capacitance
.022uF
Package / Case
0805
Lead Free Status / RoHS Status
Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
GCM21B5C1H223JA16L
Manufacturer:
MURATA
Quantity:
640 000
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
No.
20 Beam Load Test
21
Medium Voltage for Automotive Soft Termination Type GCJ Series Specifications and Test Methods
Continued from the preceding page.
Capacitance
Temperature
Character-
istics
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
AEC-Q200
Test Item
Capacitance
Change
The chip endure following force.
Within 15%
Chip thickness F 1.25mm rank: 15N
Chip thickness U 1.25mm rank: 54.5N
Specifications
Place the capacitor in the beam load fixture as Fig. 4.
Apply a force.
Speed supplied the Stress Load: 2.5mm / s
The capacitance change should be measured after 5 minutes
at each specified temperature stage.
The ranges of capacitance change compared with the above
25 C value over the temperature ranges shown in the table
should be within the specified ranges.
Specifications and Test Methods
•Pretreatment
Perform the heat treatment at 150+0/-10 C for 60 5 minutes
and then let sit for 24 2 hours at room temperature.
Perform the initial measurement.
Step
1
2
3
4
5
AEC-Q200 Test Method
L
0.6 L
Temperature ( C)
Fig. 4
125 3
-55 3
25 2
25 2
25 2
C03E.pdf
49
10.5.20
3