570AAA000107DG Silicon Laboratories Inc, 570AAA000107DG Datasheet - Page 31
![no-image](/images/manufacturer_photos/0/6/609/silicon_laboratories_inc_sml.jpg)
570AAA000107DG
Manufacturer Part Number
570AAA000107DG
Description
OCS I2C PROG LVPECL 3.3V 5X7
Manufacturer
Silicon Laboratories Inc
Series
Si570r
Type
Standardr
Datasheet
1.570AAA000107DG.pdf
(32 pages)
Specifications of 570AAA000107DG
Supply Voltage
3.3V
Frequency
10MHz
Frequency Stability
±50ppm
Operating Temperature
-40°C ~ 85°C
Current - Supply (max)
130mA
Mounting Type
Surface Mount
Size / Dimension
0.276" L x 0.197" W (7.00mm x 5.00mm)
Height
0.065" (1.65mm)
Package / Case
SMD 7.00mm x 5.00mm
Supply Current
120mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
Q4882349
T1041597
T1041597
D
Revision 1.0 to Revision 1.1
Revision 1.1 to Revision 1.2
OCUMENT
Restored programming constraint information on
page 15 and in Table 12, page 12.
Clarified NC (No Connect) pin designations in Tables
13–14 on pages 22–23.
Replaced “Unfreeze to Newfreq Delay” with the
clearer terminology “Unfreeze to Newfreq Timeout”
on page 15 and in Table 12 on page 13.
Added Freeze M procedure on page 14 for
preventing output clock changes during small
frequency change multi-register RFREQ writes.
Added Freeze M, Freeze VCADC, and RST_REG
versus RECALL information to Register 135
references in "4. Serial Port Registers" on pages 17
and 20.
Added Si570 20 ppm Total Stability Ordering Option
to Figure 6 on page 27.
Updated Figure 8 and Table 16 on page 29 to
include production test sidepads. This change is for
reference only as the sidepads are raised above the
seating plane and do not impact PCB layout.
Corrected errors in Table 11 on page 13.
C
HANGE
L
IST
Rev. 1.3
Revision 1.2 to Revision 1.3
Updated Table 3 on page 6 to include 7 ppm
temperature stability and 20 ppm to stability
parameters. Also changed aging test condition
(frequency drift over life) from 15 years to 20 years.
Updated 2.5 V/3.3 V and 1.8 V CML output level
specification for Table 4 on page 7.
Added footnotes clarifying max offset frequency test
conditions in Table 5 on page 8.
Updated ESD HBM sensitivity rating and the JEDEC
standard in Note 2 in Table 10 on page 12.
Updated Table 11 on page 13 to include "Moisture
Sensitivity Level" and "Contact Pads" rows.
Added Si570 7 ppm Total Stability Ordering Option to
Figure 6 on page 27.
Updated Figure 7 and Table 15 on page 28 to reflect
specific marking information. Previously, Figure 7
was generic.
Clarified "3.1.2. Reconfiguring the Output Clock for
Large Changes in Output Frequency" on page 15
and added new registers 13-18 in "4. Serial Port
Registers" on page 18 for the Si570 7 ppm
temperature stability / 20 ppm total stability ordering
option.
Added text to "3. Functional Description" on page 14,
paragraph 1, to state that the total output jitter
complies to and exceeds strict requirements of
various high-speed communication systems.
Si570/Si571
31