AD8202YRZ-RL Analog Devices Inc, AD8202YRZ-RL Datasheet - Page 4

• Manufacturer Part Number: AD8202YRZ-RL
• Description: IC,Differential Amplifier,SINGLE,SOP,8PIN,PLASTIC
• Manufacturer: Analog Devices Inc

Specifications of AD8202YRZ-RL

• Amplifier Type: Differential
• Number Of Circuits: 1
• Slew Rate: 0.28 V/µs
• Gain Bandwidth Product: 50kHz
• Current - Input Bias: 40nA
• Voltage - Input Offset: 1000µV
• Current - Supply: 250µA
• Voltage - Supply, Single/dual (±): 3.5 V ~ 12 V
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Output Type: -
• Current - Output / Channel: -
• -3db Bandwidth: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD8202
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Supply Voltage
Transient Input Voltage (400 ms)
Continuous Input Voltage (Common Mode)
Reversed Supply Voltage Protection
Operating Temperature Range
Storage Temperature
Output Short-Circuit Duration
Lead Temperature Range (Soldering, 10 sec)
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Die
SOIC
MSOP
Rating
12.5 V
44 V
35 V
0.3 V
−40°C to +150°C
−40°C to +125°C
−40°C to +125°C
−65°C to +150°C
Indefinite
300°C
Rev. D | Page 4 of 20
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.