AD9629-65EBZ Analog Devices Inc, AD9629-65EBZ Datasheet - Page 20
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AD9629-65EBZ
Manufacturer Part Number
AD9629-65EBZ
Description
12 Bit 65 Msps Low Pwr ADC
Manufacturer
Analog Devices Inc
Datasheet
1.AD9629BCPZRL7-20.pdf
(32 pages)
Specifications of AD9629-65EBZ
Number Of Adc's
1
Number Of Bits
12
Sampling Rate (per Second)
65M
Data Interface
Serial, SPI™
Inputs Per Adc
1 Differential
Input Range
2 Vpp
Power (typ) @ Conditions
81.7mW @ 65MSPS
Voltage Supply Source
Analog and Digital
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
AD9629
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD9629
CLOCK INPUT CONSIDERATIONS
For optimum performance, clock the AD9629 sample clock inputs,
CLK+ and CLK−, with a differential signal. The signal is typi-
cally ac-coupled into the CLK+ and CLK− pins via a transformer
or capacitors. These pins are biased internally (see Figure 45)
and require no external bias.
Clock Input Options
The AD9629 has a very flexible clock input structure. The clock
input can be a CMOS, LVDS, LVPECL, or sine wave signal.
Regardless of the type of signal being used, clock source jitter is
of great concern, as described in the Jitter Considerations section.
Figure 46 and Figure 47 show two preferred methods for clock-
ing the AD9629. The CLK inputs support up to 4× the rated
sample rate when using the internal clock divider feature. A low
jitter clock source is converted from a single-ended signal to a
differential signal using either an RF transformer or an RF balun.
The RF balun configuration is recommended for clock frequencies
between 80 MHz and 320 MHz, and the RF transformer is recom-
mended for clock frequencies from 3 MHz to 200 MHz. The
back-to-back Schottky diodes across the transformer/balun
secondary limit clock excursions into the AD9629 to ~0.8 V p-p
differential.
CLOCK
Figure 47. Balun-Coupled Differential Clock (Up to 4× Rated Sample Rate)
INPUT
Figure 46. Transformer-Coupled Differential Clock (3 MHz to 200 MHz)
CLOCK
INPUT
CLK+
50Ω
0.1µF
50Ω
1nF
Figure 45. Equivalent Clock Input Circuit
1nF
2pF
100Ω
ADT1-1WT, 1:1 Z
Mini-Circuits
XFMR
0.1µF
AVDD
0.9V
®
0.1µF
0.1µF
0.1µF
0.1µF
SCHOTTKY
SCHOTTKY
HSMS2822
HSMS2822
DIODES:
DIODES:
2pF
CLK+
CLK–
CLK–
CLK+
CLK–
ADC
ADC
Rev. 0 | Page 20 of 32
CLOCK
This limit helps prevent the large voltage swings of the clock
from feeding through to other portions of the AD9629 while
preserving the fast rise and fall times of the signal that are critical
to a low jitter performance.
If a low jitter clock source is not available, another option is to
ac couple a differential PECL signal to the sample clock input
pins, as shown in Figure 48. The
AD9513/AD9514/AD9515/AD9516/AD9517
offer excellent jitter performance.
A third option is to ac couple a differential LVDS signal to the
sample clock input pins, as shown in Figure 49. The AD9510/
AD9511/AD9512/AD9513/AD9514/AD9515/AD9516/AD9517
clock drivers offer excellent jitter performance.
In some applications, it may be acceptable to drive the sample
clock inputs with a single-ended 1.8 V CMOS signal. In such
applications, drive the CLK+ pin directly from a CMOS gate, and
bypass the CLK− pin to ground with a 0.1 μF capacitor (see
Figure 50).
Input Clock Divider
The AD9629 contains an input clock divider with the ability
to divide the input clock by integer values of 1, 2, or 4.
CLOCK
CLOCK
CLOCK
CLOCK
INPUT
INPUT
INPUT
INPUT
INPUT
Figure 49. Differential LVDS Sample Clock (Up to 4× Rated Sample Rate)
Figure 48. Differential PECL Sample Clock (Up to 4× Rated Sample Rate)
Figure 50. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz)
50kΩ
50kΩ
50Ω
1
50Ω RESISTOR IS OPTIONAL.
0.1µF
1
0.1µF
0.1µF
50kΩ
0.1µF
0.1µF
50kΩ
V
CC
1kΩ
1kΩ
LVDS DRIVER
PECL DRIVER
CMOS DRIVER
AD951x
AD951x
AD951x
240Ω
AD9510/AD9511/AD9512/
OPTIONAL
240Ω
100Ω
0.1µF
100Ω
100Ω
0.1µF
0.1µF
0.1µF
0.1µF
clock drivers
0.1µF
CLK+
CLK–
CLK+
CLK–
CLK+
CLK–
ADC
ADC
ADC