ADM1810-5ARTZ-REEL Analog Devices Inc, ADM1810-5ARTZ-REEL Datasheet - Page 4
![no-image](/images/manufacturer_photos/0/0/57/analog_devices_inc_sml.jpg)
ADM1810-5ARTZ-REEL
Manufacturer Part Number
ADM1810-5ARTZ-REEL
Description
IC,VOLT DETECTOR,FIXED,+4.62V,TO-236,3PIN,PLASTIC
Manufacturer
Analog Devices Inc
Type
Simple Reset/Power-On Resetr
Datasheet
1.ADM1815-R23ARTZ-R7.pdf
(16 pages)
Specifications of ADM1810-5ARTZ-REEL
Number Of Voltages Monitored
1
Output
Push-Pull, Totem Pole
Reset
Active Low
Reset Timeout
100 ms Minimum
Voltage - Threshold
4.62V
Operating Temperature
-40°C ~ 105°C
Mounting Type
Surface Mount
Package / Case
SOT-23-3, TO-236-3, Micro3™, SSD3, SST3
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ADM1810-5ARTZ-REEL7
Manufacturer:
ADI/亚德诺
Quantity:
20 000
ADM1810-ADM1813/ADM1815-ADM1818
ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
V
Input Current
Operating Temperature Range
θ
θ
Lead Temperature (Soldering, 10 sec)
Storage Temperature Range
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degrada-
tion or loss of functionality.
JA
JA
CC
A
Vapor Phase (60 sec)
Infrared (15 sec)
Thermal Impedance, SOT-23
Thermal Impedance, SC70
= 25°C, unless otherwise noted.
Rating
−0.3 V to +6.0 V
20 mA
−40°C to +105°C
270°C/W
146°C/W
300°C
215°C
220°C
−65°C to +150°C
Rev. D | Page 4 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum ratings for extended periods of time may affect
device reliability.