ADM811-3TARTZ-RL7 Analog Devices Inc, ADM811-3TARTZ-RL7 Datasheet - Page 4

• Manufacturer Part Number: ADM811-3TARTZ-RL7
• Description: IC,VOLT DETECTOR,FIXED,+3.08V,CMOS,TO-253LOW,4PIN,PLASTIC
• Manufacturer: Analog Devices Inc
• Type: Simple Reset/Power-On Resetr

Specifications of ADM811-3TARTZ-RL7

• Package / Case: SOT-143, SOT-143B, TO-253AA
• Mounting Type: Surface Mount
• Operating Temperature: -40°C ~ 85°C
• Output: Push-Pull, Totem Pole
• Reset: Active Low
• Number Of Voltages Monitored: 1
• Reset Timeout: 140 ms Minimum
• Voltage - Threshold: 3.08V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADM811/ADM812
ABSOLUTE MAXIMUM RATINGS
Typical values are at T
Table 2.
Parameter
Terminal Voltage (With Respect to Ground)
Input Current
Output Current
Power Dissipation (T
Derate by 4 mW/°C Above 70°C
Operating Temperature Range
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
ESD Rating
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
V
All Other Inputs
V
MR
RESET
RT-4 (SOT-143)
θ
Vapor Phase (60 sec)
Infrared (15 sec)
JA
CC
CC
Thermal Impedance
A
= 70°C)
A
= 25°C, unless otherwise noted.
Rating
−0.3 V to +6 V
−0.3 V to V
20 mA
20 mA
20 mA
200 mW
330°C/W
−40°C to +85°C
−65°C to +160°C
300°C
215°C
220°C
3 kV
CC
+ 0.3 V
Rev. D | Page 4 of 12
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.