CAT5111ZI-00-GT3 Catalyst / ON Semiconductor, CAT5111ZI-00-GT3 Datasheet - Page 4

• Manufacturer Part Number: CAT5111ZI-00-GT3
• Description: Digital Potentiometer ICs DPP,NV 100 taps Up/Down w/Buf
• Manufacturer: Catalyst / ON Semiconductor

Specifications of CAT5111ZI-00-GT3

• Number Of Pots: Single
• Taps Per Pot: 100
• Resistance: 100 KOhms
• Wiper Memory: Non Volatile
• Buffered Wiper: Buffered
• Digital Interface: Serial
• Operating Supply Voltage: 2.5 V to 6 V
• Supply Current: 100 uA, 200 uA
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Description/function: 100-Tap Digitally Programmable Potentiometer (DPP) with Buffered Wiper
• Mounting Style: SMD/SMT
• Supply Voltage (max): 6 V
• Supply Voltage (min): 2.5 V
• Tolerance: +/- 20 %
• Package / Case: MSOP-8
• Temperature Coefficient: 300 PPM / C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. This parameter is tested initially and after a design or process change that affects the parameter.
2. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to V
Table 1. OPERATION MODES
Table 2. ABSOLUTE MAXIMUM RATINGS
Table 3. RELIABILITY CHARACTERISTICS
Supply Voltage
Inputs
Operating Ambient Temperature
Junction Temperature
Storage Temperature
Lead Soldering (10 s max)
I
High to Low
High to Low
LTH
V
ZAP
V
CS to GND
INC to GND
U/D to GND
R
R
R
Commercial (‘C’ or Blank suffix)
Industrial (‘I’ suffix)
High
Low
INC
Symbol
CC
(Notes 1, 2)
H
L
WB
X
N
T
to GND
to GND
(Note 1)
END
DR
to GND
to GND
Low to High
Low to High
ESD Susceptibility
Latch−Up
Data Retention
Endurance
High
Low
Low
CS
Parameter
Parameters
High
U/D
Low
X
X
X
Figure 3. Potentiometer Equivalent Circuit
C
C
H
L
MIL−STD−883, Test Method 3015
JEDEC Standard 17
MIL−STD−883, Test Method 1008
MIL−STD−883, Test Method 1003
No Store, Return to Standby
Store Wiper Position
http://onsemi.com
Wiper toward R
Wiper toward R
R
R
Test Method
H
L
Operation
Standby
4
R
WI
H
L
C
W
R
WB
−0.5 to V
−0.5 to V
−0.5 to V
−0.5 to V
−0.5 to V
−0.5 to V
−40 to +85
−65 to 150
1,000,000
−0.5 to +7
Ratings
0 to 70
2000
+150
+300
Min
100
100
CC
CC
CC
CC
CC
CC
CC
+0.5
+0.5
+0.5
+0.5
+0.5
+0.5
+ 1 V
Typ
Max
Units
°C
°C
°C
°C
°C
V
V
V
V
V
V
V
Stores
Units
Years
mA
V