RE46C190S16TF Microchip Technology, RE46C190S16TF Datasheet
RE46C190S16TF
Specifications of RE46C190S16TF
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RE46C190S16TF Summary of contents
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... Internal Infrared Emitter Diode (IRED) driver • Adjustable IRED Drive current • Adjustable Hush Sensitivity • 2% Low Battery Set Point 2010 Microchip Technology Inc. RE46C190 Description The RE46C190 is a low power, low voltage CMOS photoelectric type smoke detector IC. With minimal ...
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... Smoke Comparator + Control - Logic and Timing Trimmed Oscilator POR and BIAS High Normal Programming Control LX (16) Boost Control Current Sense Boost Comparator + - V (15) BST RLED (8) Level Shift Horn Driver HB (13) HS (14) FEED (10) IO (12) Interconnect GLED (9) 2010 Microchip Technology Inc. ...
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... Schottky diode D1 must have a maximum peak current rating of at least 1.5A. For best results it should have forward voltage specification of less than 0.5V at 1A, and low reverse leakage. 5: Inductor L1 must have a maximum peak current rating of at least 1.5A. 2010 Microchip Technology Inc µH ...
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... RE46C190 NOTES: DS22271A-page 4 2010 Microchip Technology Inc. ...
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... Unless otherwise stated, production test is at room temperature with guardbanded limits. Not production tested. 4: 2010 Microchip Technology Inc. † Notice: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation listings of this specification is not implied ...
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... IRCAP = 5V, BST (100 mA option selected 27° IRED on 1V, IRED V = 5V, IRCAP = 5V, BST (150 mA option selected 27° IRED on 1V, IRED V = 5V, IRCAP = 5V, BST (200 mA option selected 27°C) A %/° 5V, IRCAP = 5V; BST Note 4 is forced externally with the BST 2010 Microchip Technology Inc. ...
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... Typical values are for design information only. 2: Limits over the specified temperature range are not production tested and are based on characterization 3: data. Unless otherwise stated, production test is at room temperature with guardbanded limits. Not production tested. 4: 2010 Microchip Technology Inc. noted)(Note 1, Note 2, Note Min ...
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... Standby, no alarm s Standby, after one valid smoke sample s Standby, after two consecutive valid smoke samples s Local Alarm (three consecutive valid smoke samples) ms Push button test, >1 chamber detections ms Push button test, no chamber detections s In remote alarm 2010 Microchip Technology Inc. ...
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... All other AC parameters are verified by functional testing. 2: PCLK IRON Typical values are for design information only. 3: Limits over the specified temperature range are not production tested, and are based on characterization 4: data. 2010 Microchip Technology Inc. (Note 1 to Note 4). Min Typ Max ...
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... Standby, no alarm Min No alarm Hours EOL Enabled; Standby µs Prog Bits 3,4 = 1,1 µs Prog Bits 3,4 = 0,1 µs Prog Bits 3,4 = 1,0 µs Prog Bits 3,4 = 0,0 = 0V, Except where noted in the SS Units Conditions °C °C °C/W 2010 Microchip Technology Inc. ...
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... V Boosted voltage produced by DC-DC converter. BST 16 LX Open drain NMOS output, used to drive the boost converter inductor. The inductor should be connected from this pin to the positive supply through a low resistance path. 2010 Microchip Technology Inc. Table 2-1. Function RE46C190 . ...
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... RE46C190 NOTES: DS22271A-page 12 2010 Microchip Technology Inc. ...
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... HUSH • Chamber Test and Push-to-Test modes In addition, there are user selectable integrator gain settings to optimize detection levels (see 2010 Microchip Technology Inc. 3.3 Supervisory Tests Once every 86 seconds, the status of the battery voltage is checked by enabling the boost converter for 10 ms and comparing a fraction of the V an internal reference ...
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... All four limits stored during calibration are adjusted by this drift factor. Drift sampling is suspended during Hush, Local Smoke and Remote Smoke conditions. 2010 Microchip Technology Inc. ...
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... TABLE 4-2: FEATURES PROGRAMMING Features Tone Select 10 Year End-of-life Indicator Photo Chamber Long Term Drift Adjustment Low Battery Hush Hush Options 2010 Microchip Technology Inc. Range 100-400 µs 50-200 mA 2.1 – 2.8V Typical Maximum Input Current (nA) 100 µs 200 µs ...
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... GLED HB GLED HB GLED HB GLED HB GLED HB GLED Gamp IntegOut SmkComp Gamp IntegOut SmkComp Gamp IntegOut SmkComp Gamp IntegOut SmkComp RLED GLED Serial Out ( ) Gamp IntegOut SCMP Gamp IntegOut SCMP Gamp IntegOut SCMP Gamp IntegOut SCMP 2 RLED GLED HB 2010 Microchip Technology Inc ...
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... FEED as a clock input, and then be stored in the internal EEPROM. The detailed steps are as follows: 1. Power up with bias conditions as shown in Figure 4-1. At power-up TEST = TEST2 = FEED = Smoke Chamber FIGURE 4-1: Nominal Application Circuit for Programming. 2010 Microchip Technology Inc. . RE46C190 IRED BST TEST ...
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... W-x W-x W-x LTD LB0 LB1 bit 32 W-x W-x W-x PAGF0 NL4 bit 24 W-x W-x W-x HYL3 HYL2 HYL1 bit 16 W-x W-x W-x HUL0 CTL4 CTL3 bit 8 W-x W-x W-x LTD2 LTD1 LTD0 bit Bit is unknown 2010 Microchip Technology Inc. ...
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... HYL<4:0>: Hysteresis Limits bits 00000 = 0 00001 = 1 • • • 11110 = 30 11111 = 31 bit 14-10 HUL<4:0>: Hush Limits bits 00000 = 0 00001 = 1 • • • 11110 = 30 11111 = 31 2010 Microchip Technology Inc. (Section 3.2) (Section 3.2) (Section 3.6) RE46C190 DS22271A-page 19 ...
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... If any changes are required, power down the part and return to reentered. bit 29 bit 30 bit 31 bit 32 bit 33 bit 34 Min Thold1 = 1 µs Min PW1 = 10us Min µs , then DD Step 1. All bit values must be bit 35 bit 36 bit 37 bit 38 Min Td1 = 2 µs … Min PW2 = 10 ms 2010 Microchip Technology Inc. ...
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... C1 10 µF Push-To-Test/ 3V Hush C2 1 µF V BST 100 µF 330 100 TP1 TP2 Smoke Chamber RED GREEN V4 V5 FIGURE 4-3: Circuit for Programming in the Typical Application. 2010 Microchip Technology Inc. can be used RE46C190 IRED BST TEST TEST2 IO 12 IRP 6 IRCAP ...
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... FEED low to high to make the baseline measurement. 8. After limits have been set and baseline LTD measurement has been made, pulse IO to store all results in memory. Before this step, no limits Figure 4-4. are stored in memory BST . Once the chamber is SS 2010 Microchip Technology Inc. ...
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... FEED V SS Min Td2 = 10 µ Min PW2 = 10 ms GLED … IRED … RLED HB FIGURE 4-4: Timing Diagram for Modes T1 to T5. 2010 Microchip Technology Inc. Min PW1 = 10 µs Min µs … … RE46C190 Min PW5 = 2 ms … … … … DS22271A-page 23 ...
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... Integration Time IRED current Low Battery Trip Point Long Term Drift Enable Hush Option Low Battery Hush Enable EOL enable Tone Select D11 D12 D13 D14 D15 … D39 … Min µs … Min PW2 = 10 ms 2010 Microchip Technology Inc. ...
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... Min Tsetup2 = 2 µs Min PW3 = 100 µs Min T2 = 120 µs Vbst FEED GLED IRED RLED HB FIGURE 4-6: Timing Diagram for Modes T7-T10. 2010 Microchip Technology Inc. Test Description Min Td2 = 10 µs Min PW5 = 2 ms … … RE46C190 … … … … DS22271A-page 25 ...
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... To enter this mode, clock TEST to Mode T11 (11 clocks). The IO pin is configured as horn enable TEST2 BST TEST V SS Min Tsetup2 = 2 µs Min PW3 = 100 µ FIGURE 4-7: Timing Diagram for Mode T11. DS22271A-page 26 Min T2 = 120 µs Horn Enabled 2010 Microchip Technology Inc. ...
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... The current for both the IR diode and the internal measurement circuitry comes primarily from the average current must be BST scaled for both on-time and boost voltage. 2010 Microchip Technology Inc. A calculation of the standby current for the battery life is shown in parameters: V BAT ...
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... Some number of false alarms and user tests should also be included in any calculation. For ten year applications spiral wound lithium manganese dioxide battery with a laser seal is recommended. These can be found with capacities of 1400 to 1600 mAh. DS22271A-page 28 during 2010 Microchip Technology Inc. ...
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... Low Battery Test (Internal signal) RLED HORN T Chamber Test (Internal Signal) HORN FIGURE 5-1: RE46C190 Timing Diagram – Standby, No Alarm, Low Supply Test Failure and Chamber Test Failure. 2010 Microchip Technology Inc. Standby, No Alarm (not to Scale RON T PER0 T PCT1 T PLB2 T ...
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... Local Alarm with Temporal Horn Pattern (not to Scale) T PER3A T HOF2A Local Alarm with International Horn Pattern (not to Scale) T IRO N T PER3B T PLED2B T HO F2B Interconnect as Input with Temporal Horn pattern (not to Scale) Interconnect as Input with International Horn Pattern (not to Scale) T HOF3A 2010 Microchip Technology Inc. ...
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... Alarm, No Low Battery RLED T T ON1 PLED2 HB TEST FIGURE 5-3: RE46C190 Timing Diagram – Alarm Memory and Hush Timer. 2010 Microchip Technology Inc. Alarm Memory (not to Scale) Alarm Memory; No Alarm; No Low Battery Alarm Memory After 24 Hour Timer T PLED1 T T ON1 OFLED ...
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... RE46C190 NOTES: DS22271A-page 32 2010 Microchip Technology Inc. ...
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... In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. 2010 Microchip Technology Inc. Customer-specific information Year code (last digit of calendar year) Year code (last 2 digits of calendar year) Week code (week of January 1 is week ‘ ...
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... RE46C190 /HDG 3ODVWLF 6PDOO 2XWOLQH 6/ ± 1DUURZ PP %RG\ >62,&@ 1RWH N NOTE 1RWHV DS22271A-page α φ A2 β 2010 Microchip Technology Inc. ...
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... Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging 2010 Microchip Technology Inc. RE46C190 DS22271A-page 35 ...
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... RE46C190 NOTES: DS22271A-page 36 2010 Microchip Technology Inc. ...
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... APPENDIX A: REVISION HISTORY Revision A (December 2010) • Original Release of this Document. 2010 Microchip Technology Inc. RE46C190 DS22271A-page 37 ...
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... RE46C190 NOTES: DS22271A-page 38 2010 Microchip Technology Inc. ...
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... CMOS Photoelectric Smoke Detector ASIC (Tape and Reel) Package S = Small Plastic Outline - Narrow, 3.90 mm Body, 16-Lead (SOIC) 2010 Microchip Technology Inc. X Examples: a) RE46C190S16F: Lead Free b) RE46C190S16TF: RE46C190 . 16LD SOIC Package, Lead Free 16LD SOIC Package, Tape and Reel, Lead Free DS22271A-page 39 ...
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... RE46C190 NOTES: DS22271A-page 40 2010 Microchip Technology Inc. ...
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... PICtail, REAL ICE, rfLAB, Select Mode, Total Endurance, TSHARC, UniWinDriver, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. ...
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... Philippines - Manila Tel: 63-2-634-9065 Fax: 63-2-634-9069 Singapore Tel: 65-6334-8870 Fax: 65-6334-8850 Taiwan - Hsin Chu Tel: 886-3-6578-300 Fax: 886-3-6578-370 Taiwan - Kaohsiung Tel: 886-7-213-7830 Fax: 886-7-330-9305 Taiwan - Taipei Tel: 886-2-2500-6610 Fax: 886-2-2508-0102 Thailand - Bangkok Tel: 66-2-694-1351 Fax: 66-2-694-1350 2010 Microchip Technology Inc. 08/04/10 ...