M38510/20302BEA QP SEMICONDUCTOR, M38510/20302BEA Datasheet - Page 19

• Manufacturer Part Number: M38510/20302BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/20302BEA

• Lead Free Status / RoHS Status: Not Compliant

manufacturer’s circuit designator.
procedures shall be used for programming the device.
4.6
4.7
a. Connect the device in the electrical configuration for programming. The waveforms on figure 5a and the
b. Address the PROM with the binary address of the word to be programmed. Address inputs are TTL compatible.
c. Apply V
d. Bring the CE
e. Disable the programming circuitry by applying a voltage of V
f. Raise V
g. After a delay equal to or greater than t
h. Lower V
i. Enable the PROM for verification by applying V
j. Apply V
k. Repeat steps a through j for all other bits to be programmed in the PROM.
l. If any bit does not verify as programmed, it shall be considered a programming reject.
Programming procedure identification. The programming procedure to be utilized shall be identified by the
Programming procedure for circuit A. The programming characteristics in table IVA and the following
programming characteristics in table IVA shall apply to these procedures.
An open circuit shall not be used to address the PROM.
compatible. An open circuit shall not be used to disable the devices.
output selected for programming. Note that the PROM is supplied with fuses intact, which generates an output
high. Programming a fuse will cause the output to go low.
PL
CC
PHV
CC
voltage to V
to V
to V
to V
X
PH
PL
CC
inputs high and the CE
with rise time less than or equal to t
following a delay to t
and verify bit is programmed.
CC
.
D1
D2
X
apply only one pulse with amplitude of V
from programming enable pulse applied to an output.
inputs low to disable the device. The chip enables are TTL
MIL-M-38510/203E
IL
to CE
19
TLH.
X
and V
OPD
IH
to the outputs of the PROM.
to CE
X .
OPE
and duration of t
p
to the