MMDOE28G5MPP-0VA Samsung Semiconductor, MMDOE28G5MPP-0VA Datasheet - Page 21

• Manufacturer Part Number: MMDOE28G5MPP-0VA
• Manufacturer: Samsung Semiconductor

Specifications of MMDOE28G5MPP-0VA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

MMDOE28G5MPP-0VA
MMCRE64G5MPP-0VA
7.3.1.6 S.M.A.R.T. Selective self-test routine
When the value in the LBA Low register is 4 or 132, the Selective self-test routine shall be performed. This selftest routine shall include the ini-
tial tests performed by the Extended self-test routine plus a selectable read scan. The host shall not write the Selective self-test log while the
execution of a Selective self-test command is in progress.
The user may choose to do read scan only on specific areas of the media. To do this, user shall set the test spans desired in the Selective self-
test log and set the flags in the Feature flags field of the Selective self-test log to indicate do not perform off-line scan. In this case, the test
spans defined shall be read scanned in their entirety. The Selective self-test log is updated as the self-test proceeds indicating test progress.
When all specified test spans have been completed, the test is terminated and the appropriate self-test execution status is reported in the
SMART READ DATA response depending on the occurrence of errors. Figure on page 21 shows an example of a Selective selftest definition
with three test spans defined. In this example, the test terminates when all three test spans have been scanned.
After the scan of the selected spans described above, a user may wish to have the rest of media read scanned as an off-line scan. In this
case, the user shall set the flag to enable off-line scan in addition to the other settings. If an error occurs during the scanning of the test spans,
the error is reported in the self-test execution status in the SMART READ DATA response and the off-line scan is not executed. When the test
spans defined have been scanned, the device shall then set the offline scan pending and active flags in the Selective self-test log to one, the
span under test to a value greater than five, the self-test execution status in the SMART READ DATA response to 00h, set a value of 03h in
the off-line data collection status in the SMART READ DATA response and shall proceed to do an off-line read scan through all areas not
included in the test spans. This off-line read scan shall completed as rapidly as possible, no pauses between block reads, and any errors
encountered shall not be reported to the host. Instead error locations may be logged for future reallocation. If the device is powered-down
before the off-line scan is completed, the off-line scan shall resume when the device is again powered up. From power-up, the resumption of
the scan shall be delayed the time indicated in the Selective self-test pending time field in the Selective self-test log. During this delay time the
pending flag shall be set to one and the active flag shall be set to zero in the Selective self-test log. Once the time expires, the active flag shall
be set to one, and the off-line scan shall resume. When the entire media has been scanned, the off-line scan shall terminate, both the pending
and active flags shall be cleared to zero, and the off-line data collection status in the SMART READ DATA response shall be set to 02h indicat-
ing completion.
During execution of the Selective self-test, the self-test executions time byte in the Device SMART Data Structure may be updated but the
accuracy may not be exact because of the nature of the test span segments. For this reason, the time to complete off-line testing and the self-
test polling times are not valid. Progress through the test spans is indicated in the selective self-test log.
A hardware or software reset shall abort the Selective self-test except when the pending bit is set to one in the Selective self-test log (see
7.3.7). The receipt of a SMART EXECUTE OFF-LINE IMMEDIATE command with 0Fh, Abort off-line test routine, in the LBA Low register shall
abort Selective self-test regardless of where the device is in the execution of the command. If a second self-test is issued while a selective
self-test is in progress, the selective self-test is aborted and the newly requested self-test is executed.
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Final