5962-9080303MLA QP SEMICONDUCTOR, 5962-9080303MLA Datasheet - Page 5

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5962-9080303MLA

Manufacturer Part Number
5962-9080303MLA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-9080303MLA

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DSCC FORM 2234
APR 97
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 42 (see MIL-PRF-38535, appendix A).
in a wide variety of configurations, two processing options are provided for selection in the contract, using an altered item
drawing.
and table IIA. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program
configuration.
herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery.
be done for initial characterization and after any design or process change which may affect data retention. The methods and
procedures may be vendor specific, but shall guaranteed over the full military temperature range. The vendor's procedure shall
be kept under document control and shall be made available upon request of the acquiring or preparing activity, along with test
data.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
3.10.1 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to result
3.10.2 Unprogrammed device delivered to the user. All testing shall be verified through group A testing as defined in 4.4.1
3.10.3 Manufacturer-programmed device delivered to the user. All testing requirements and quality assurance provisions
3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
C
SHEET
5962-90803
5

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