57C49C-35J STMicroelectronics, 57C49C-35J Datasheet - Page 4
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57C49C-35J
Manufacturer Part Number
57C49C-35J
Description
Manufacturer
STMicroelectronics
Datasheet
1.57C49C-35J.pdf
(7 pages)
Specifications of 57C49C-35J
Density
64Kb
Organization
8Kx8
Access Time (max)
35ns
Operating Current
40mA
Interface Type
Parallel
Operating Temperature Classification
Commercial
Operating Supply Voltage (typ)
5V
Operating Temp Range
0C to 70C
Pin Count
28
Mounting
Surface Mount
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Lead Free Status / RoHS Status
Supplier Unconfirmed
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NOTES: 4. This parameter is only sampled and is not 100% tested.
TEST LOAD
WS57C49C
2-42
CAPACITANCE
NOTE: 6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
2.01 V
D.U.T.
SYMBOL
C
C
C
IN
OUT
VPP
5.Typical values are for T
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between V
Inadequate decoupling may result in access time degradation or other transient performance failures.
(High Impedance Test Systems)
98
(4)
Output Capacitance
Input Capacitance
V
T
PARAMETER
PP
A
= 25°C, f = 1 MHz
Capacitance
A
= 25°C and nominal supply voltages.
30 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
CONDITIONS
V
V
V
OUT
PP
IN
= 0 V
= 0V
= 0V
A.C. TESTING INPUT/OUTPUT WAVEFORM
A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V
for a logic "0." Timing measurements are made at 1.5 V for
input and output transitions in both directions.
3.0
0.0
TYP
18
4
8
1.5
(5)
CC
POINTS
TEST
and ground is recommended.
MAX
12
25
6
1.5
UNITS
pF
pF
pF