AD5262BRUZ200 Analog Devices Inc, AD5262BRUZ200 Datasheet - Page 6

• Manufacturer Part Number: AD5262BRUZ200
• Description: IC POT DUAL 200K 256POS 16TSSOP
• Manufacturer: Analog Devices Inc

Specifications of AD5262BRUZ200

• Taps: 256
• Resistance (ohms): 200K
• Number Of Circuits: 2
• Temperature Coefficient: 35 ppm/°C Typical
• Memory Type: Volatile
• Interface: 4-Wire SPI Serial
• Voltage - Supply: 4.5 V ~ 16.5 V, ±4.5 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 16-TSSOP
• Resistance In Ohms: 200K
• End To End Resistance: 200kohm
• Track Taper: Linear
• No. Of Steps: 256
• Resistance Tolerance: ± 30%
• Supply Voltage Range: 4.5V To 16.5V, ± 4.5V To ± 5.5V
• Control Interface: Serial, SPI
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5260/AD5262
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
V
V
V
V
V
A
Digital Inputs and Output Voltage
Operating Temperature Range
Maximum Junction Temperature
Storage Temperature Range
Lead Temperature (Soldering,10 sec)
Thermal Resistance
1
2
Maximum terminal current is bounded by the maximum current handling of
the switches, maximum power dissipation of the package, and maximum
applied voltage across any two of the A, B, and W terminals at a given
resistance setting.
Package power dissipation = (T
DD
SS
DD
L
A
A
X
, V
Intermittent
Continuous
to GND
(T
Vapor Phase (60 sec)
Infrared (15 sec)
14-Lead TSSOP
16-Lead TSSOP
to GND
to B
=25°C, unless otherwise noted.
to GND
to GND
to V
J MAX
B
, V
X
W
, A
SS
)
to GND
X
to W
1
X
, B
X
2
to W
θ
JA
X
J MAX
− T
A
)/θ
JA
.
Rating
−0.3 V to +17 V
0 V to −7 V
17 V
0 V to +7 V
V
±20 mA
±5 mA
−0.3 V to V
+7 V (whichever is less)
−40°C to +85°C
150°C
−65°C to +150°C
300°C
215°C
220°C
206°C/W
150°C/W
SS
, V
DD
L
+ 0.3 V, or
Rev. A | Page 6 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION