TWR-K53N512-KIT Freescale Semiconductor, TWR-K53N512-KIT Datasheet - Page 5
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TWR-K53N512-KIT
Manufacturer Part Number
TWR-K53N512-KIT
Description
TWR-K53N512 Dev Kit
Manufacturer
Freescale Semiconductor
Series
Kinetisr
Type
MCUr
Specifications of TWR-K53N512-KIT
Kit Contents
TWR-K53N512 - 32bit MCU Module With MK53N512CMD100 & TWRPI-SLCD Daughter Card, DVD With IDE Software
Mcu Supported Families
K50
Kit Features
MK53N512CMD100 MAPBGA 144 Pins MCU, Tower
Rohs Compliant
Yes
Contents
Board
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
For Use With/related Products
Tower System
4
4.1 Common features among the K50 family
All devices within the K50 family features the following at a minimum:
Freescale Semiconductor, Inc.
Operating characteristics
Core features
System and power management
Clocks
Memories and Memory Interfaces
Security and integrity
Features
Table 1. Common features among all K50 devices
K50 Family Product Brief, Rev. 8, 5/2011
Table continues on the next page...
• Voltage range 1.71V - 3.6V
• Flash memory programming down to 1.71V
• Temperature range (T
• Flexible modes of operation
• Next generation 32-bit ARM Cortex-M4 core
• Supports DSP instructions
• Nested vectored interrupt controller (NVIC)
• Asynchronous wake-up interrupt controller (AWIC)
• Debug & trace capability
• Software and hardware watchdog with external monitor
• DMA controller
• Low-leakage wake-up unit (LLWU)
• Power management controller with 10 different power
• Non-maskable interrupt (NMI)
• 128-bit unique identification (ID) number per chip
• Multi-purpose clock generator
• 3MHz to 32MHz crystal oscillator
• 32kHz to 40kHz crystal oscillator
• Internal 1kHz low power oscillator
• DC to 50MHz external square wave input clock
• FlexMemory consisting of FlexNVM (non-volatile flash
• Flash security and protection features
• Serial flash programming interface (EzPort)
• Cyclic redundancy check (CRC)
pin
modes
memory that can execute program code, store data, or
backup EEPROM data) or FlexRAM (RAM memory
that can be used as traditional RAM or as high-
endurance EEPROM storage, and also accelerates
flash programming)
• 2-pin serial wire debug (SWD)
• IEEE 1149.1 Joint Test Action Group (JTAG)
• IEEE 1149.7 compact JTAG (cJTAG)
• Trace port interface unit (TPIU)
• Flash patch and breakpoint (FPB)
• Data watchpoint and trace (DWT)
• Instrumentation trace macrocell (ITM)
• PLL and FLL operation
• Internal reference clocks
A
) -40 to 85°C
Features
5