YC124JR0722RL Yageo, YC124JR0722RL Datasheet - Page 5

• Manufacturer Part Number: YC124JR0722RL
• Manufacturer: Yageo

Feb 04, 2005 V.1
TESTS AND REQUIREMENTS
TEST
Thermal Shock
Table 4 Test condition, procedure and requirements
Coefficient of
Temperature
Temperature
Resistance to
Short Time
Withstand
Resistance
Operation
Resistance
Dielectric
Insulation
Overload
Soldering
(T.C.R.)
Voltage
Heat
Low
Life
Chip Resistor Surface Mount
TEST METHOD
MIL-STD-202F-method 304;
JIS C 5202-4.8
MIL-STD-202F-method 107G;
IEC 60115-1 4.19
MIL-R-55342D-Para 4.7.4
MIL-R-55342D-Para 4.7.5;
IEC 60115-1 4.13
MIL-STD-202F-method 302;
IEC 60115-1 4.6.1.1
MIL-STD-202F-method 301;
IEC 60115-1 4.6.1.1
MIL-STD-202F-method 210C;
IEC 60115-1 4.18
MIL-STD-202F-method 108A;
IEC 60115-1 4.25.1
PROCEDURE
At +25/–55 °C and +25/+125 °C
Formula:
T.C.R = ------------------------- × 10
Where
t
t
R
R
At –65 (+0/–10) °C for 2 minutes and at +155
(+10/–0) °C for 2 minutes; 25 cycles
At –65 (+0/–5) °C for 1 hour; RCWV applied for
45 (+5/–0) minutes
2.5 × RCWV applied for 5 seconds at room
temperature
RCOV for 1 minute
Maximum voltage (V
Unmounted chips; 260 ±5 °C for 10 ±1 seconds
At 70 ±2 °C for 1,000 hours; RCWV applied for
1.5 hours on and 0.5 hour off
Type
Voltage (DC)
Type
Voltage (AC)
1
2
1
2
= +25 °C or specified room temperature
= –55 °C or +125 °C test temperature
= resistance at reference temperature in ohms
= resistance at test temperature in ohms
YC
R
R
1
(t
SERIES
2
2
– R
– t
1
1
100 V
)
rms
YC124
YC124
100 V
124 (Pb Free)
) applied for 1 minute
rms
6
(ppm/°C)
REQUIREMENTS
Refer to table 2
±(0.5% +0.05 Ω) for 1% tol.
±(1.0% +0.05 Ω) for 5% tol.
±(0.5% +0.05 Ω) for 1% tol .
±(1.0% +0.05 Ω) for 5% tol.
No visible damage
±(1.0% +0.05 Ω) for 1% tol.
±(2.0% +0.05 Ω) for 5% tol.
No visible damage
≥10 GΩ
No breakdown or flashover
±(0.5% +0.05 Ω) for 1% tol.
±(1.0% +0.05 Ω) for 5% tol.
No visible damage
±(1% +0.05 Ω) for 1% tol.
±(3% +0.05 Ω) for 5% tol.
Product specification
www.yageo.com
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