MC33388DR2 Freescale Semiconductor, MC33388DR2 Datasheet - Page 13

• Manufacturer Part Number: MC33388DR2
• Description: IC TOLERANT CAN INT FAULT 14SOIC
• Manufacturer: Freescale Semiconductor

Specifications of MC33388DR2

• Controller Type: CAN Interface
• Interface: CAN
• Voltage - Supply: 4.75 V ~ 5.25 V
• Current - Supply: 5mA
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 14-SOIC (3.9mm Width), 14-SOL
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: Q1163428C

MC33388
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Introduction
and high susceptibility performances (EMC). The source for
both disturbance and susceptibility is primarily coming form the
bus line wires. They are by far the longest connections
compared to the printed circuit board of the application
receiving the MC333388, the microcontroller and the other
components.
complete application, the MC33388 minimizes the common
mode voltage and current glitches occurring at each bus
transition: from dominant to recessive and from recessive to
dominant. This is achieves by excellent matching in signal
transition between CANL and CANH. The common mode
voltage and current glitches are defined as follow:
fault condition, for instance one CAN bus connection shorted to
fixed voltage, e.g GND, the common mode will be considerably
degraded.
voltage measured at CANL and CANH pins.
EMI Noise
Figure 6. Min. Susceptibility Level With Modulation
1.0
The device is designed for optimized noise emission (EMI)
In order to minimize the HF noise generated by the
CmV = (Vcanh+Vcanl)/2,
CmI = (Icanh+Icanl)/2.
The device is optimized for dual wires operations. Under a
Figure below shows the typical signals for common mode
Common Mode
Glitch
100mV/div
NERR: 5V/div
Tx: 5V/div
Figure 5. Typical Common Mode Glitch
Measured at CANL CANH
NO SUSCEPTIBILITY AREA
10
FREQUENCY (MHz)
LIMIT OF TEST (49dB) (No Susceptibility)
Archived by Freescale Semiconductor, Inc., 2008
100
Susceptibility Points
Electromagnetic Compatibility
1000
MOTOROLA
dependant upon immediate device environment, such as bus
capacitor loading, bus wire length and type, etc.... In addition,
the symmetry of the CANL and CANH bus lines is key parameter
to optimize common mode glitches. For instance un-symmetry
could result in different parasitic capacitors value between
CANL to GND and CANH to GND and will increase common
mode glitches and degrade overall system performances.
EMC Susceptibility Performances
field disturbances. The bus lines are by far the primary antenna
for external field coupling to the CANL, CANH, Rtl and Rth
connections. The device performances are characterized using
the Bulk Current Injection (BCI) test method, derivated from
specification ISO 11452-4.
schematic very close to the typical application schematic, figure
4. Main difference is that the microcontroller is replaced by an
external generator and analyzer connected to RX, TX and
NERR through optical link. A network composed of two nodes
equipped with MC33388, one in emitter and one in receiver is
evaluated. The disturbance is applied to both CANL and CANH
twisted pair bus line lines with appropriate coupling clamp.
transmit bits. When received bits are different from transmit bits
the device is considered as fail for the particular frequency.
Results
performances in the frequency range of 1 to 400MHz with target
of injected current of 200mA and 316mA.
susceptibility is observed, the next frequency point is analyzed,
until reaching the max frequency, 400Mhz. If a susceptibility is
observed for a particular frequency, the free point is marked.
of 316mA or 49dBmA with a 1KHz 80% modulation added to the
injected current. Figure 8 shows the susceptibility levels with a
target susceptibility level of 200mA or 46dBmA without
modulation added to the injected current.
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46
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Figure 7. Min. Susceptibility Level Without Modulation
1.0
CAUTION: The common mode voltage characteristics are
The MC33388 is optimized for high immunity from external
Susceptibility evaluation with BCI:
The component is configured according to the electrical
During test sequences, received bits are compared to
Figures 7 and 8 below describe the device susceptibility
When the target current is reached and when no
Figure 7 below shows results with a target susceptibility level
NO SUSCEPTIBILITY AREA
10
LIMIT OF TEST (46dB) (No Susceptibility)
FREQUENCY (MHz)
100
Susceptibility Points
13
1000