53220A Agilent Technologies Test Equipment, 53220A Datasheet - Page 15

• Manufacturer Part Number: 53220A
• Description: Universal Frequency Counter/Timer, 350 MHz, 12 digit/sec, 100 ps
• Manufacturer: Agilent Technologies Test Equipment
• Type: Counter/Timer350 MHz Universal Frequency Counter/Timer, 12 digit/sec, 100 psr

Specifications of 53220A

• Frequency Range: DC coupled 1 mHz to 350 MHz; AC coupled 10 Hz to 350 MHz
• Input Impedance: Selectable 1 MΩ ±1.5% or 50Ω ±1.5%
• Input Type: Front panel BNC
• Input, Range: ±5 V (± 50 V) full scale ranges
• Noise: 500 μVrms (max), 350 μVrms (typ)
• Number Of Channels: 3 channels
• Sensitivity: DC - 100 MHz: 20 mVpk > 100 MHz: 40 mVpk

Accuracy Specifications
Definitions
Random Uncertainty
The rss sum of all random or Type-A measurement errors expressed as the total RMS or 1-σ measurement uncertainty. Random
uncertainty will reduce as 1/√N when averaging N measurement results for up to a maximum of approximately 13-digits or 100 fs.
Systematic Uncertainty
The 95% confidence residual constant or Type-B measurement uncertainty relative to an external calibration reference.
Generally, systematic uncertainties can be minimized or removed for a fixed instrument setup by performing relative measurements to
eliminate the systematic components.
Timebase Uncertainty
The 95% confidence systematic uncertainty contribution from the selected timebase reference. Use the appropriate uncertainty for the
installed timebase or when using an external frequency reference substitute the specified uncertainty for your external frequency
reference.
Basic accuracy
Optional Microwave Channel Opt 150 - Pulse/Burst Measurements
PRF, PRI
(0 dBm, -6 dB threshold)
Pulse/burst Carrier Frequency
(Narrow Mode) (parts error)
(0 dBm, -6 dB threshold)
Pulse/burst Carrier Frequency
(Wide Mode) (parts error)
(0 dBm, -6 dB threshold)
Time Interval (TI)
Rise/Fall Time
Frequency Ratio A/B (typ)
Single Period measurement
Phase
Measurement Function
Totalize
(fraction of cycle error)
Volts pk to pk
Period (parts error)
Period (parts error)
Option 106 & 115:
13
5, 9, 16
(parts error)
(parts error)
(parts error)
Frequency
Frequency
Duty
11
5v range
(counts error)
(Degrees error)
5, 9, 10, 16
7, 16
16
1
=
, Width
(parts error)
12
k * (Random Uncertainty ± Systematic Uncertainty ± Timebase Uncertainty)
3
3
16
(typ)
6, 16
, or
5
13, 14
14, 15
2* (T
of the worst case Freq input
2* (T
1-σ Random Uncertainty
1.4 x Random Uncertainty
SS
2* (T
typ: 1.4 * (T
max: 4 * (T
2
SS
+ T
1.4* (T
1.4* (T
TI Measurement
TI Measurement
R
1.4* (T
R
R
2
E
R
ss
Burst Width
E
E
+ T
E
± 1 count
x Burst Width
R
E
2
+Carrier Period)
x Gate Time
x Gate Time
)
E
x Gate Time
10*T
½
x Gate Time
2*T
E
SS
SS
2
SS
* Frequency * 360º
)
2
2
2
SS
½
SS
SS
+ T
+ T
+ T
SS
2
* Frequency
2
+ T
+ T
11
E
E
E
2
2
2
)
)
)
E
½
E
2
½
½
2
)
)
½
½
15
3
linearity = T
offset
Uncertainty of Frequency A plus Uncertainty
If R
If R
DC-1 KHz: ± 0.15 % rdg ± 0.15 % of range
if Burst Width < 10ms 10
If R
1 MHz-200 MHz: ±1 % range ± 5 % rdg
(T
E
E
>=2: 10
1 KHz-1 MHz: ±2 % rdg± 1 % range
>=2: 10
LTE
8
E
<2 or REC mode (R
(typ) = T
+skew+2*T
± 30 % x(Freq/250 MHz)rdg
(T
Systematic Uncertainty
LTE
Period Measurement
-11
accuracy
-11
TI Measurement
+ 2*T
10
If R
/gate max, 2*10
/gate max, 2*10
of Frequency B
10
-11
Burst Width
LTE
E
-10
/Burst Width
/TI Measurement
<2 10
2*T
accuracy
accuracy
+ skew + T
/(R
T
accuracy
accuracy
E
*gate)
-10
)*Frequency
)*Frequency*360º
E
/gate
=1): 2*10
-10
/Burst Width
accuracy
-12
-12
/gate typ
/gate typ
-10
/gate
4
4
Uncertainty
Timebase
●
●
●
●
●
●
2