PEB 24911 H V1.3 Lantiq, PEB 24911 H V1.3 Datasheet - Page 113

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PEB 24911 H V1.3

Manufacturer Part Number
PEB 24911 H V1.3
Description
Manufacturer
Lantiq
Datasheet

Specifications of PEB 24911 H V1.3

Lead Free Status / Rohs Status
Supplier Unconfirmed
4.4.4
The DFE-Q V2.1 features dedicated test modes to enable and ease system
measurements on U-interface. How these test modes can be used to conduct the most
frequently needed system measurements is described in the following sections.
4.4.4.1
In the send single pulses test mode the U-transceiver transmits on the U-interface
alternating
Single-Pulses” (SSP) mode:
– hardware selection:
– software selection:
Both methods are fully equivalent besides the fact that the HW selection impacts all line
ports while the SW selection impacts only the chosen line. In SSP-mode the C/I-code
transmitted by the DFE-Q V2.1 is DEAC.
The SSP-test mode is required for pulse mask measurements.
4.4.4.2
When selecting the data-through test mode the DFE-Q V2.1 is forced directly into the
“Transparent” state. This is possible from any state in the state diagram.
Note: Data Through is a pure test mode. It is not suited to replace the activation/
The Data-Through option (DT) provides the possibility to transmit a standard scrambled
U-signal even if no U-interface wake-up protocol is possible. This feature is of interest
when no counter station can be connected to supply the wake-up protocol signals.
As with the SSP-mode, two options are available.
– hardware selection:
– software selection:
Both methods are fully equivalent besides the fact that the HW selection impacts all line
ports while the SW selection is channel selective.
Note: In contrast to former versions, C/I-command ’ARL’ is not executed while Data
The DT test mode is required for power spectral density and total power measurements.
4.4.4.3
In the reset mode the DFE-Q V2.1 does not transmit any signals. The chip is in RESET
state. All echo canceller and equalizer coefficients are reset.
Data Sheet
deactivation procedures for normal operation, which are described in
Chapter
Through test mode is activated with pin DT = ’1’.
System Measurements
Single-Pulses Test Mode (SSP)
Data Through Test Mode (DT)
Reset Mode
3 pulses spaced by 1.5 ms. Two options exist for selecting the “Send-
4.3.
Pin-SSP= ’1’
C/I code= SSP (0101
Pin-DT= ’1’
C/I code= DT (0110
103
B
)
B
)
Operational Description
PEF 24911
2001-07-16

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