LC4256ZE-B-EVN Lattice, LC4256ZE-B-EVN Datasheet - Page 41

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LC4256ZE-B-EVN

Manufacturer Part Number
LC4256ZE-B-EVN
Description
Programmable Logic Development Tools ispMACH 4256ZE Breakout Board
Manufacturer
Lattice
Series
ispMACH®r
Type
CPLDr

Specifications of LC4256ZE-B-EVN

Contents
Board, Cable
Lead Free Status / Rohs Status
 Details
For Use With/related Products
LC4256ZE-5TN144C
Lattice Semiconductor
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 11.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Table 11. Test Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
1. C
L
includes test fixtures and probe capacitance.
Test Condition
DUT
106 106
106
106
R
1
106
106
R
2
V
R 1
R 2
41
CCO
35pF
35pF
35pF
5pF
5pF
C
L
ispMACH 4000V/B/C/Z Family Data Sheet
1
C L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
1.5V
1.5V
V
V
OH
OL
+ 0.3
- 0.3
0213A/ispm4k
Timing Ref.
Point
Test
CCO
CCO
/2
/2
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = 1.65V
3.0V
3.0V
3.0V
3.0V
V
CCO

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