MPR084QR2 Freescale Semiconductor, MPR084QR2 Datasheet - Page 27
![IC CTLR TOUCH SENSOR PROX 16-QFN](/photos/38/65/386548/qfn-16_sml.jpg)
MPR084QR2
Manufacturer Part Number
MPR084QR2
Description
IC CTLR TOUCH SENSOR PROX 16-QFN
Manufacturer
Freescale Semiconductor
Type
Capacitiver
Datasheet
1.MPR084EJ.pdf
(40 pages)
Specifications of MPR084QR2
Number Of Inputs/keys
8 Key
Data Interface
I²C, Serial
Voltage - Supply
1.8 V ~ 3.6 V
Current - Supply
1.62mA
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
16-QFN Exposed Pad
Output Type
Voltage
Interface
I²C
Input Type
Logic
Supply Voltage
3.3 V
Dimensions
5 mm L x 5 mm W x 1 mm H
For Use With
KITMPR084EVM - KIT EVAL 8-PAD TOUCH MPR084
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Sensors
Freescale Semiconductor
Appendix A Electrical Characteristics
A.1
This section contains electrical and timing specifications.
A.2
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table A-1 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section. This device contains circuitry protecting against damage due to high static
voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher
than maximum-rated voltages to this high-impedance circuit.
A.3
Normal handling precautions should be used to avoid exposure to static discharge.
Qualification tests are performed to ensure that these devices can withstand exposure to reasonable levels of static without
suffering any permanent damage. During the device qualification ESD stresses were performed for the Human Body Model
(HBM), the Machine Model (MM) and the Charge Device Model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
Table 20. Absolute Maximum Ratings - Voltage (with respect to VSS)
Supply Voltage
Input Voltage
Operating Temperature Range
Storage Temperature Range
Introduction
Absolute Maximum Ratings
ESD and Latch-up Protection Characteristics
SCL, SDA, AD0, IRQ, ATTN,
SOUNDER
Table 21. ESD and Latch-up Test Conditions
Human Body Model (HBM)
Machine Model (MM)
Charge Device Model (CDM)
Latch-up current at T
Rating
Rating
A
= 85°C
Symbol
TSG
V
T
V
DD
SG
IN
Symbol
I
V
V
V
LATCH
ESD
ESD
ESD
VSS - 0.3 to VDD + 0.3
-0.3 to +3.8
-55 to +150
±2000
Value
-40 to +85
±200
±500
±100
Value
Unit
mA
V
V
V
Unit
°C
°C
V
V
MPR084
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