MAX9217ETM+T Maxim Integrated Products, MAX9217ETM+T Datasheet - Page 14

IC SERIALIZER LVDS 48-TQFN

MAX9217ETM+T

Manufacturer Part Number
MAX9217ETM+T
Description
IC SERIALIZER LVDS 48-TQFN
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of MAX9217ETM+T

Function
Serializer
Data Rate
700Mbps
Input Type
LVTTL/LVCMOS
Output Type
LVDS
Number Of Inputs
27
Number Of Outputs
1
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
48-TQFN Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
27-Bit, 3MHz-to-35MHz
DC-Balanced LVDS Serializer
Separate the LVTTL/LVCMOS inputs and LVDS output to
prevent crosstalk. A four-layer PCB with separate layers
for power, ground, and signals is recommended.
The MAX9217 ESD tolerance is rated for Human Body
Model, Machine Model, and ISO 10605. ISO 10605
Figure 14. Human Body ESD Test Circuit
Figure 15. ISO 10605 Contact-Discharge ESD Test Circuit
PROCESS: CMOS
14
______________________________________________________________________________________
VOLTAGE
SOURCE
VOLTAGE
SOURCE
HIGH-
HIGH-
DC
DC
CHARGE-CURRENT-
CHARGE-CURRENT-
LIMIT RESISTOR
LIMIT RESISTOR
50Ω TO 100Ω
1MΩ
100pF
330pF
C
C
S
S
RESISTANCE
DISCHARGE
RESISTANCE
DISCHARGE
STORAGE
CAPACITOR
STORAGE
CAPACITOR
Chip Information
1.5kΩ
2kΩ
R
R
D
D
ESD Protection
Board Layout
DEVICE
UNDER
DEVICE
UNDER
TEST
TEST
specifies ESD tolerance for electronic systems. The
Human Body Model, Machine Model, discharge com-
ponents are C
The ISO 10605 discharge components are C
and R
charge components are C
(Figure 16).
For the latest package outline information and land patterns, go
to www.maxim-ic.com/packages.
Figure 16. Machine Model ESD Test Circuit
PACKAGE TYPE
48 LQFP
48 TQFN
VOLTAGE
SOURCE
D
HIGH-
DC
= 2kΩ (Figure 15). The Machine Model dis-
CHARGE-CURRENT-
LIMIT RESISTOR
S
= 100pF and R
PACKAGE CODE
200pF
Package Information
C
S
T4866+1
C48+5
RESISTANCE
DISCHARGE
STORAGE
CAPACITOR
S
R
= 200pF and R
D
D
= 1.5kΩ (Figure 14).
DOCUMENT NO.
21-0054
21-0141
S
DEVICE
UNDER
TEST
= 330pF
D
= 0Ω

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