NOIS1SM0250A-HHC ON Semiconductor, NOIS1SM0250A-HHC Datasheet - Page 14

• Manufacturer Part Number: NOIS1SM0250A-HHC
• Manufacturer: ON Semiconductor

Specifications of NOIS1SM0250A-HHC

• Lead Free Status / Rohs Status: Supplier Unconfirmed

Other Signals
Tie SELECT signal to V
added for diagnostic reasons and inhibits the pixel array
operation when held low.
The CAL signal sets the output amplifier DC offset level. When
this signal is active (high) the pixel array is internally
disconnected from the output amplifier, its gain is set to unity and
its input signal is connected to the BLACK_REF input. Perform
this action at least once for each frame.
EOS_X, EOS_YL, and EOS_YR produce a pulse when the
respective shift register comes at its end. These outputs are used
mainly during testing to verify proper operation of the shift
registers.
Column Start
Address
CLK ADC
ADC Out
SYNC_X
CLK_X
Analog
Output
LD_X
DD
for normal operation. This signal is
Row Blanking Time
T15
Figure 12. Timing to Load X and Y Registers
T16
Rev. 7 | www.onsemi.com | Page 14 of 22
T17
T18
T19
T20
TESTDIODE and TESTPIXEL_ARRAY are connections to
optical test structures that are used for electro optical evaluation.
TESTDIODE is a plain photodiode with an area of 14x5 pixels.
TESTPIXEL_ARRAY is an array (14x5) of pixels where the
photodiodes are connected in parallel. These structures
measure the photocurrent of the diodes directly.
TESTPIXEL_RESET and TESTPIXEL-OUT are connections to
a single pixel that are used for testing.
Time Available for Read Out of Row Y
Pixel 1
T21
T23
T22
NOIS1SM0250A
Pixel 1
Pixel 2
Pixel 3
Pixel 2