SCAN928028TUFX National Semiconductor, SCAN928028TUFX Datasheet - Page 5

SCAN928028TUFX

Manufacturer Part Number
SCAN928028TUFX
Description
Manufacturer
National Semiconductor
Datasheet

Specifications of SCAN928028TUFX

Lead Free Status / Rohs Status
Not Compliant

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Symbol
f
t
t
t
t
t
t
t
MAX
S
H
S
H
W
W
REC
Symbol
SCAN Circuitry Timing Requirements
Over recommended operating supply and temperature ranges unless otherwise specified.
Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.
Note 2: Typical values are given for V
Note 3: Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are referenced to ground except VOD, and
ΔVOD which are differential voltages.
Note 4: BIST_SEL have a weak internal pull-up. In a noisy operating environment, it is recommended that an external pull up be used to ensure that BIST_SEL
is in the high state.
Note 5: t
Note 6: t
Note 7: t
crossing in comparsion with the ideal bit position. See Figure 10
AC Timing Diagrams and Test Circuits
t
t
RJIT
DJIT
DJIT
LLHT
RJIT
specification is measured with the serializer output transmitting checkerboard patterns. It is a measurement of the center distribution of 0V (differential)
Deterministic Jitter,
Parameter
Maximum TCK Clock
Frequency
TDI to TCK, H or L
TDI to TCK, H or L
TMS to TCK, H or L
TMS to TCK, H or L
TCK Pulse Width, H or L
TRST Pulse Width, L
Recovery Time, TRST to
TCK
, t
specification is the rms jitter measurement of the serializer output when the device is transmitting SYNC pattern.
LHLT
Random Jitter
Parameter
Figure 10
, t
DJIT
and t
RJIT
specifications are Guaranteed by Design using statistical analysis.
CC
= 3.3V and T
C
C
L
L
=10pF to GND
=10pF to GND
Conditions
R
R
(Note 5)
(Note 6)
(Note 5)
(Note 7)
L
L
= 100Ω,
= 100Ω,
FIGURE 1. ’Worst Case Icc Test Pattern
A
Conditions
R
C
= +25°C.
L
L
= 500Ω,
= 35 pF
Pin/Freq.
18MHz
66MHz
18MHz
66MHz
5
10.0
Min
2.0
1.0
2.0
1.0
2.5
2.5
18
−225
−150
Min
20052103
Typ
Typ
−55
39
18
20
Max
Max
257
45
21
68
www.national.com
Units
MHz
Units
ps (p-
ps (p-
(rms)
(rms)
ns
ns
ns
ns
ns
ns
ns
ps
ps
p)
p)

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