74ABT00D NXP Semiconductors, 74ABT00D Datasheet - Page 3

• Manufacturer Part Number: 74ABT00D
• Description: Gates (AND / NAND / OR / NOR) QUAD 2-IN NAND GATE
• Manufacturer: NXP Semiconductors

Specifications of 74ABT00D

• Product: NAND
• Logic Family: 74ABT
• Number Of Gates: Quad
• Number Of Lines (input / Output): 2 / 4
• High Level Output Current: - 15 mA
• Low Level Output Current: 20 mA
• Propagation Delay Time: 4.1 ns
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 4.5 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Package / Case: SOT-108
• Minimum Operating Temperature: - 40 C
• Lead Free Status / Rohs Status: Details
• Other names: 74ABT00D,112

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
Philips Semiconductors
ABSOLUTE MAXIMUM RATINGS
NOTES:
RECOMMENDED OPERATING CONDITIONS
DC ELECTRICAL CHARACTERISTICS
NOTES:
1995 Sep 18
SYMBOL
SYMBOL
SYMBOL
SYMBOL
Quad 2-input NAND gate
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 C.
V
V
I
I
T
V
I
V
V
V
OFF
CEX
I
T
I
OUT
V
I
V
I
I
CC
amb
I
I
OK
OUT
OH
t/ v
OH
V
V
OL
OL
I
stg
O
CC
CC
IK
CC
IK
I
IH
IL
I
I
Input clamp voltage
High-level output voltage
Low-level output voltage
Input leakage current
Power-off leakage current
Output High leakage current
Output current
Quiescent supply current
Additional supply current per
input pin
DC supply voltage
DC input diode current
DC input voltage
DC output diode current
DC output voltage
DC output current
Storage temperature range
DC supply voltage
Input voltage
High-level input voltage
Low-level input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature range
PARAMETER
2
1
PARAMETER
3
3
1, 2
V
V
V
V
V
V
V
V
V
inputs at V
PARAMETER
PARAMETER
CC
CC
CC
CC
CC
CC
CC
CC
CC
= 4.5V; I
= 4.5V; I
= 4.5V; I
= 5.5V; V
= 0.0V; V
= 5.5V; V
= 5.5V; V
= 5.5V; V
= 5.5V; One data input at 3.4V, other
CC
TEST CONDITIONS
IK
OH
OL
or GND
I
O
O
O
I
= GND or 5.5V
= GND or V
= –18mA
or V
= 5.5V; V
= 2.5V
= 20mA; V
= –15mA; V
I
4.5V
output in Off or High state
I
3
= GND or V
I
CC
output in Low state
= V
I
CONDITIONS
= V
IL
IL
V
or V
V
O
I
or V
< 0
< 0
IH
CC
IH
MIN
–50
2.5
T
amb
MIN
–40
4.5
2.0
0
0
TYP
–0.9
0.35
0.25
–75
2.9
0.01
5.0
= +25 C
5.0
2
LIMITS
LIMITS
–0.5 to +7.0
–1.2 to +7.0
–0.5 to +5.5
–65 to 150
MAX
–180
–1.2
500
0.5
RATING
100
50
50
1.0
–18
–50
40
MAX
V
–15
+85
5.5
0.8
T
20
5
MIN
CC
–50
amb
2.5
to +85 C
Product specification
74ABT00
= –40 C
MAX
–180
–1.2
500
0.5
100
50
50
1.0
UNIT
UNIT
ns/V
UNIT
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
C
UNIT
C
mA
V
V
V
A
A
A
A
A