ATmega16HVB Atmel Corporation, ATmega16HVB Datasheet - Page 8

• Manufacturer Part Number: ATmega16HVB
• Manufacturer: Atmel Corporation

Specifications of ATmega16HVB

• Flash (kbytes): 16 Kbytes
• Pin Count: 44
• Max. Operating Frequency: 8 MHz
• Cpu: 8-bit AVR
• # Of Touch Channels: 8
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 17
• Ext Interrupts: 15
• Usb Speed: No
• Usb Interface: No
• Spi: 1
• Twi (i2c): 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 12
• Adc Speed (ksps): 1.9
• Resistive Touch Screen: No
• Temp. Sensor: Yes
• Crypto Engine: No
• Sram (kbytes): 1
• Eeprom (bytes): 512
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 4.0 to 25
• Operating Voltage (vcc): 4.0 to 25
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 2
• Output Compare Channels: 4
• Input Capture Channels: 2
• 32khz Rtc: No
• Calibrated Rc Oscillator: Yes

3. Disclaimer
4. Resources
5. About code examples
6. Data retention
8
ATmega16HVB/32HVB
All parameters contained in this datasheet are preliminary and based on characterization of the
Atmel ATmega16/32HVB.
A comprehensive set of development tools, application notes and datasheets are available for
download on http://www.atmel.com/avr.
Note:
This documentation contains simple code examples that briefly show how to use various parts of
the device. These code examples assume that the part specific header file is included before
compilation. Be aware that not all C compiler vendors include bit definitions in the header files
and interrupt handling in C is compiler dependent. Please confirm with the C compiler documen-
tation for more details.
For I/O registers located in extended I/O map, “IN”, “OUT”, “SBIS”, “SBIC”, “CBI”, and “SBI”
instructions must be replaced with instructions that allow access to extended I/O. Typically
“LDS” and “STS” combined with “SBRS”, “SBRC”, “SBR”, and “CBR”.
Reliability Qualification results show that the projected data retention failure rate is much less
than one PPM over 20 years at 85°C or 100 years at 25°C.
1.
8042CS–AVR–06/11