8134-HC-12P3 TE Connectivity, 8134-HC-12P3 Datasheet - Page 5

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8134-HC-12P3

Manufacturer Part Number
8134-HC-12P3
Description
Manufacturer
TE Connectivity
Datasheets

Specifications of 8134-HC-12P3

Socket Length (mm [in])
4.06 [0.160]
Sealant
Without
Proprietary Name
HOLTITE
Recommended Hole Size (mm [in])
2.08 [0.082]
Mating Pin Dia. Range (mm [in])
0.89 – 1.14 [0.035 – 0.045]
Spring Material
Beryllium Copper
Contact Spring Plating
Tin Lead
Contact Base Material
Beryllium Copper
Insertion Method
Hand/Semi-Automatic
Government/industry Qualification
No
Rohs/elv Compliance
RoHS compliant, ELV compliant
Lead Free Solder Processes
Not relevant for lead free process
Rohs/elv Compliance History
Always was RoHS compliant
Application
Production
Packaging Method
Loose Piece
4.
4.1.
4.2.
4.3.
4.4.
Rev B
QUALITY ASSURANCE PROVISIONS
Qualification Testing
A.
B.
Requalification Testing
If changes significantly affecting form, fit or function are made to the product or manufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of the original testing
sequence as determined by development/product, quality and reliability engineering.
Acceptance
Acceptance is based on verification that the product meets the requirements of Figure 1. Failures
attributed to equipment, test setup or operator deficiencies shall not disqualify the product. If product
failure occurs, corrective action shall be taken and specimens resubmitted for qualification. Testing to
confirm corrective action is required before resubmittal.
Quality Conformance Inspection
The applicable quality inspection plan shall specify the sampling acceptable quality level to be used.
Dimensional and functional requirements shall be in accordance with the applicable product drawing
and this specification.
Specimen Selection
Specimens shall be prepared in accordance with applicable Instruction Sheets and shall be
selected at random from current production. All test groups shall each consist of a minimum of 32
specimens.
Test Sequence
Qualification inspection shall be verified by testing specimens as specified in Figure 2.
Low level Contact Resistance Measurement Points
Figure 3
108-1979
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