MBM29PL160TD Fujitsu Microelectronics, Inc., MBM29PL160TD Datasheet - Page 27

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MBM29PL160TD

Manufacturer Part Number
MBM29PL160TD
Description
16m 2m X 8/1m X 16 Bit
Manufacturer
Fujitsu Microelectronics, Inc.
Datasheet

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Note: Test Conditions: Output Load: 1 TTL gate and 30 pF (MBM29PL160TD/BD-75)
JEDEC
AC CHARACTERISTICS
• Read Only Operations Characteristics
t
t
t
t
t
t
t
GHQZ
AVAV
AVQV
ELQV
GLQV
EHQZ
AXQX
Parameter
Symbols
Notes: C
Standard
MBM29PL160TD
t
t
t
t
t
PACC
ELFH
t
t
t
ELFL
t
t
t
ACC
PRC
OH
RC
CE
OE
DF
DF
C
L
L
= 30 pF including jig capacitance (MBM29PL160TD/BD-75)
= 100 pF including jig capacitance (MBM29PL160TD/BD-90)
Read Cycle Time
Address to Output Delay
Page Read Cycle Time
Page Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output HIGH-Z
Output Enable to Output HIGH-Z
Output Hold Time From Address, CE
or OE, Whichever Occurs First
CE or BYTE Switching Low or High
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Input: 1.5 V
Output: 1.5 V
Device
Under
Test
Description
1 TTL gate and 100 pF (MBM29PL160TD/BD-90)
Figure 4
C
L
-75/-90
Test Conditions
/MBM29PL160BD
IN3064
or Equivalent
CE = V
OE = V
CE = V
OE = V
OE = V
6.2 k
Test Setup
IL
IL
IL
IL
IL
3.3 V
Max.
Max.
Max.
Max.
Max.
Max.
Max.
Min.
Min.
Min.
2.7 k
(Note)
Diodes = IN3064
or Equivalent
-75
75
75
25
25
75
25
20
20
4
4
(Note)
-90
90
90
35
35
90
30
30
35
5
5
-75/-90
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
27

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