T213A105J050ASC Kemet Corporation, T213A105J050ASC Datasheet - Page 80

• Manufacturer Part Number: T213A105J050ASC
• Description: Tantalum Hermetically Sealed / Axial
• Manufacturer: Kemet Corporation

KEMET
to improved reliability. It can be pursued too far, however,
when it leads to installation of higher voltage capacitors of
much larger size. Inherent failure rate is roughly propor-
tional to CV
age. The effect becomes particularly noticeable above 50-
volt ratings. It is possible to lose more via higher inherent
failure rate than is gained by voltage derating.
failure rate has been statistically determined for a given
group of capacitors.
duction batch of KEMET High Reliability capacitors, as
described in Specification GR500 Catalog F2956. As
noted above, not all capacitance/voltage rate values are
inherently equal in failure rate. GR500 capacitors are
processed and subjected to 100% reliability testing as a
homogeneous group of one capacitance/voltage value.
Failure rate under standard conditions is available from 1
to 0.001% Khr, depending upon the capacitance/voltage
value.
ification MIL-C-39003. Failure rates as low as 0.001%/Khr
are available for all capacitance/voltage values in given
groups under this test program. The specifications and
80
Figure 12.
TABLE 3
Circuit Impedance
125
120
110
100
90
85
80
70
60
50
40
30
25
Voltage “de-rating” is a common and useful approach
The relationships shown are more useful when the
Failure rate is statistically determined for each pro-
Several Series are qualified under U.S. military spec-
T
(ohms/volt)
Connect the temperature and
applied voltage ratio of
interest with a straight edge.
The multiplier of failure rate is
given at the intersection of this
line with the model scale.
Given T
Rate Multiplier F1
Given T, & F2
Read Reguired Voltage V2
Given F3 & V3
Read Allowable Temp T3
1.6
0.1
0.2
0.4
0.6
0.8
1.0
2.0
3 or greater
, where C is capacitance and V is rated volt-
Relationship of Failure Rate to Impedance
1
& V1 Read Failure
®
Reliability Nomograph
KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606 [phone]
APPLICATION NOTES FOR TANTALUM CAPACITORS
Failure Rate Improvement
F
(multiplying factors)
10
10
10
1.0
10
10
10
10
10
10
10
10
3
2
1
-1
-2
-3
-4
-5
-6
-7
-8
1.0
.8
.6
.4
.3
.2
.1
.07
Rating
125 C
Rating
85 C
V
1.2
1.1
1.0
0.9
0.8
0.7
0.67
0.6
0.5
0.4
0.3
0.2
0.1
their accompanying Qualified Products Lists should be
consulted for details.
internal sampling program is operated by KEMET Quality
Assurance. The confidence level chosen for reporting the
data is 60%. However, the cost of sampling each batch
produced is overwhelmingly prohibitive, and no claim is
made concerning knowledge of failure rate for any partic-
ular lot shipped. It is demonstrated that average failure
rate for all commercial Series is between .1 and 1%/Khr at
standard conditions and 60% confidence after 2,000
hours’ testing, +85°C, and rated voltage and ≤ 1 ohm total
series resistance.
17. SURGE CURRENT
steady-state DC voltage. Experience indicates that AC rip-
ple, within the limits prescribed, has little effect on failure
rate. Heavy surge currents are possible in some applica-
tions, however. Circuit impedance may be very low (below
the standard 0.1 ohm/volt) or there may be driving induc-
tance to cause voltage “ringing.” Surge current may
appear during turn-on of equipment, for example.
be predictable from conventional life test data. A surge cur-
rent test is utilized to ensure against a high frequency of
such failures, and a description is available free of charge.
The test has been adopted for all capacitors under
MIL-C-39003/06/09/10 and KEMET’s GR500 specifica-
tions.
18. ENVIRONMENTAL CONSIDERATION
capacitors may be subjected. Following is a list of stan-
dard tests which every Series will survive. Data may be
available (upon request) under more severe stresses for
certain Series.
• LIFE TEST 85°C OR 125°C, 2000 Hours: When sub-
• SHELF LIFE +85°, 2000 hours. Post test of capacitor
• LEAD STRENGTH MIL-STD-202 Method 211: Pull test
a. Test condition letter—A
b. The body of the capacitor will be securely clamped
jected to 2000 hours at 85°C at full rated DC voltage, or
125°C at 2/3 of 85°C voltage, the capacitor shall meet
the following requirements when tested at 25°C:
shall meet the following requirements when tested at
25°C:
will be performed as in MIL-STD-202, Method 211. The
following details and exceptions shall apply.
For Series not covered by military specifications, and
All conventional reliability testing is conducted under
Failure rate under current-surge conditions may not
It is not possible to foresee all the conditions to which
during test.
The DCL shall be within 1.25 times the initial DCL
limit.
Capacitance shall be within ±10% of the initial mea-
sured value.
The DF shall not exceed the initial limit.
The DCL shall be within 1.5 times the initial DCL
limit.
Capacitance shall be within ±10% of the initial mea-
sured value.
The DF shall not exceed 1.5 times the initial limit.