MC10124 ON Semiconductor, MC10124 Datasheet - Page 4

• Manufacturer Part Number: MC10124
• Description: Quad TTL to MECL Translator
• Manufacturer: ON Semiconductor

1. See switching time test circuit. Propagation delay for this circuit is specified from +1.5Vdc in to the 50% point on the output waveform. The
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
ELECTRICAL CHARACTERISTICS
Negative Power Supply Drain
Current
Positive Power Supply Drain
Current
Reverse Current
Forward Current
Input Breakdown Voltage
Clamp Input Voltage
High Output Voltage
Low Output Voltage
High Threshold Voltage
Low Threshold Voltage
Switching Times
Propagation Delay
Rise Time
Fall Time
os
+3.5Vdc is shown here because all logic and supply levels are shifted 2 volts positive.
e o e Su
Characteristic
(+3.5Vdc to 50%)
y
(20 to 80%)
(20 to 80%)
(50 Load)
a
1
@ Test Temperature
Symbol
V
V
t
t
t
t
t
t
I
BV
I
V
V
CCH
6+1+
6–1–
7+1+
7–1–
7+3–
7–3+
CCL
t
t
OHA
V
OLA
I
I
I
1+
1–
(continued)
OH
R
OL
E
F
I
in
Under
Under
Test
Pin
–30 C
+25 C
+85 C
8
9
9
6
7
6
7
6
7
6
7
1
3
1
3
1
3
1
3
1
1
1
1
3
3
1
1
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TEST VOLTAGE VALUES (Volts)
MC10124
+2.40
+2.40
+2.40
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
V
V
6
7
R
R
4
+7.0 V
+5.00
+5.00
+5.00
V
V
CC
CC
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
9
–3.2 V
–5.2
–5.2
–5.2
V
V
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
EE
EE
–10
–10
–10
I
I
6
7
I
I
(mA)
+1.0
+1.0
+1.0
I
I
6
7
in
in
5,6,7,10,11,16
5,7,10,11,16
+2.0 V
Gnd
6,16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16