74F153 Philips Semiconductors, 74F153 Datasheet - Page 4

• Manufacturer Part Number: 74F153
• Description: Dual 4-line to 1-line multiplexer
• Manufacturer: Philips Semiconductors

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
Philips Semiconductors
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
RECOMMENDED OPERATING CONDITIONS
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
1996 Jan 05
V
V
I
V
I
T
T
V
V
V
I
I
I
T
V
V
V
V
V
I
I
I
I
I
IN
OUT
IK
OH
OL
I
IH
IL
OS
CC
CC
SYMBOL
SYMBOL
SYMBOL
SYMBOL
SYMBOL
amb
stg
amb
CC
IN
OUT
CC
IH
IL
O
OH
O
OL
IK
Dual 4-line to 1-line multiplexer
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
Current applied to output in Low output state
Operating free-air temperature range
Storage temperature range
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
High level output voltage
High-level output voltage
Low level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Short-circuit output current
Supply current (total)
y
PARAMETER
PARAMETER
CC
(
= 5V, T
OS
)
tests should be performed last.
amb
3
= 25 C.
PARAMETER
PARAMETER
I
I
CCH
CCL
PARAMETER
V
V
V
V
V
V
V
V
V
V
CC
IH
CC
IH
CC
CC
CC
CC
CC
CC
CC
= MIN, I
= MIN, I
= MIN, V
= MIN, V
= MIN, I
= MAX, V
= MAX, V
= MAX, V
= MAX
= MAX
TEST CONDITIONS
TEST CONDITIONS
OS
OH
OL
I
4
IL
IL
= I
, the use of high-speed test apparatus and/or sample-and-hold
I
I
I
= MAX
= MAX
= 7.0V
= 2.7V
= 0.5V
= MAX
= MAX
IK
En = GND,
Sn=In=4.5V
En=Sn=In=GND
10%V
10%V
5%V
5%V
1
1
MIN
CC
CC
4.5
2.0
CC
CC
0
LIMITS
MIN
–60
2.5
2.7
NOM
5.0
–0.5 to +7.0
–65 to +150
–0.5 to V
–0.5 to +7.0
–30 to +5
RATING
0 to +70
LIMITS
40
–0.73
TYP
0.30
0.30
3.4
12
12
CC
2
MAX
–18
+70
5.5
0.8
–1
20
Product specification
MAX
–150
0.50
0.50
–1.2
–0.6
100
20
20
20
74F153
UNIT
UNIT
UNIT
mA
mA
mA
mA
mA
V
V
V
V
V
V
UNIT
UNIT
C
C
C
mA
mA
mA
mA
V
V
V
V
V
A
A