SC26C562 Philips Semiconductors, SC26C562 Datasheet - Page 8

• Manufacturer Part Number: SC26C562
• Description: CMOS dual universal serial communications controller CDUSCC
• Manufacturer: Philips Semiconductors

1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
2. Clock may be stopped (DC) for testing purposes, or when CDUSCC is in non-operational modes.
3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static
4. Parameters are valid over specified temperature range.
5. All voltage measurements are referenced to ground (GND). For testing, all inputs except X1/CLK swing between 0.2V and 3.0V with a transi-
6. See Figure 20 for test conditions for outputs.
7. Tests for open drain outputs are intended to guarantee switching of the output transistor. Measurement of this response is referenced from
8. Execution of the valid command (after it is latched) requires 3 rising edges of X1 (see Figure 15).
9. These values were not explicitly tested; they are guaranteed by design and characterization data.
10. X1/CLK and X2 are not tested with a crystal installed.
11. X1/CLK frequency must be at least the faster of the receiver or transmitter serial data rate.
12. Timing is illustrated and referenced to the WRN and RDN inputs. The device may also be operated with CSN as the ‘strobing’ input. CSN
13. V
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
NOTES:
1998 Sep 04
SYMBOL
SYMBOL
V
V
V
V
I
I
I
I
I
I
I
I
I
I
I
C
C
C
ILX1
IHX1
SCX2
IL
IL
I
OZH
OZL
ODL
ODH
CC
IL
IH
OL
OH
CMOS dual universal serial communications controller
(CDUSCC)
IN
OUT
I/O
functional operation of the device at these or any other conditions above those indicated in the operation section of this specification is not
implied.
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima.
tion time of 20ns maximum. For X1/CLK, this swing is between 0.2V and 4.4V. All time measurements are referenced at input voltages of
0.2V and 3.0V and output voltages of 0.8V and 2.0V, as appropriate.
midpoint of the switching signal to a point 0.2V above the actual output signal level. This point represents noise margin that assures true
switching has occurred.
and RDN (also CSN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle and the signal negated
first terminates the cycle.
13
O
= 0 to V
CC
Input low voltage:
All except X1/CLK
Input high voltage except X1/CLK
Output low voltage:
All except IRQN
Output high voltage:
(Except open drain outputs)
X1/CLK input low current
X1/CLK input high current
X2 short circuit current
Input low current
Input leakage current
Output off current high, 3-State data bus
Output off current low, 3-State data bus
Open drain output low current in off
state:
Open drain output high current in off
state:
Power supply current
(see Figure 19 for graphs)
Input capacitance
Output capacitance
Input/output capacitance
RESETN, TxDAKN, RxDAKN
, Rx and Tx clocks at 10MHz, X1 clock at 10MHz.
EOPN, RDYN
IRQN
EOPN, IRQN, RDYN
X1/CLK
X1/CLK
IRQN
PARAMETER
PARAMETER
7
9
9
9
10
10
4,5 T
A
= 0 C to +70 C, V
I
I
OL
OL
=5.3mA(Comm), 4.8mA(Ind)
=8.8mA(Comm), 7.8mA(Ind)
V
IN
V
TEST CONDITIONS
TEST CONDITIONS
V
V
IN
X1 = open, V
IN
V
= 0 to V
IN
V
V
V
IN
I
= V
–40 to +85_C
–40 to +85_C
–40 to +85_C
–40 to +85_C
–40 to +85_C
= V
OH
CC
CC
CC
8
= 0, X2 = open
= 0
V
0 to 70_C
0 to 70_C
V
V
IN
CC
CC,
= GND = 0
= GND = 0
= GND = 0
= –400 A
IN
IN
,
CC
= V
, X2 = GND
CC,
0 to 70_C
= 0
= 0
0 to 70_C
V
= 5.0V +10%
CC
IN
0 to 70_C
IN
= V
= 0
CC
4,5
0.8 x V
V
CC
–150
–150
Min
–15
–15
–10
–10
–15
2.0
2.3
–1
–1
–1
–1
–0.5
CC
LIMITS
Typ
25
SC26C562
Product specification
Max
–0.5
–0.5
V
150
–15
+15
+10
+10
0.8
0.8
0.5
0.5
0.0
+1
+1
80
95
10
15
20
CC
1
UNIT
UNIT
mA
mA
mA
pF
pF
pF
V
V
V
V
V
V
V
V
A
A
A
A
A
A
A
A
A