MAS281 Dynex, MAS281 Datasheet - Page 54

• Manufacturer Part Number: MAS281
• Description: MIL-STD-1750A Microprocessor
• Manufacturer: Dynex

MAS281
11.0 RADIATION TOLERANCE
Total Dose Radiation Testing
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
compliant with MIL-STD-883 test method 1019 Ionizing
Radiation (Total Dose).
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
12.0 ORDERING INFORMATION
consisting of three chips in leadless chip carriers, mounted on
a ceramic tile. The module can be supplied with dual-in-line (C)
or flatpack (F) lead configurations.
as separate devices. They are available in leadless chip carrier
(L), flatpack (F), or ceramic dual-in-line packages (C).
54/55
Total Dose (Function to specification)*
Transient Upset (Stored data loss)
Transient Upset (Survivability)
Neutron Hardness (Function to specification)
Single Event Upset**
Latch Up
For product procured to guaranteed total dose radiation
The sample devices will be subjected to the total dose
Dynex Semiconductor can provide radiation testing
The processor can be ordered in the form of a module,
The three chips which form the processor can be packaged
Figure 32: Radiation Hardness Parameters
3x10
1x10
>1x10
>1x10
<1x10
Not possible
5
11
12
15
-10
Rad(Si)
Rad(Si)/sec
Rad(Si)/sec
n/cm
Errors/bit day
2
Module - MAx281xxx
Chip Set - MAx17501xxx
MAx17502xxx
MAx17503xxx