MA5104 Zarlink Semiconductor, MA5104 Datasheet - Page 11

• Manufacturer Part Number: MA5104
• Description: RADIATION HARD 4096 x 1 BIT STATIC RAM
• Manufacturer: Zarlink Semiconductor

MA5104
RADIATION TOLERANCE
Total Dose Radiation Testing
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
testing compliant with MIL-STD-883 test method 1019,
Ionizing Radiation (Total Dose).
SINGLE EVENT UPSET CHARACTERISTICS
10
For product procured to guaranteed total dose radiation
The sample devices will be subjected to the total dose
GEC Plessey Semiconductors can provide radiation
UPSET BIT
CROSS-SECTION
(cm
2
/bit)
Figure 17: Typical Per-Bit Upset Cross-Section vs Ion LET
Ion LET (MeV.cm
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Total Dose (Function to specification)*
Transient Upset (Stored data loss)
Transient Upset (Survivability)
Neutron Hardness (Function to specification)
Single Event Upset**
Latch Up
2
/mg)
Figure 16: Radiation Hardness Parameters
1x10
5x10
>1x10
>1x10
3.4x10
Not possible
5
10
12
15
Rad(Si)
-9
Rad(Si)/sec
Rad(Si)/sec
n/cm
Errors/bit day
2