NE5210 Philips, NE5210 Datasheet - Page 2

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NE5210

Manufacturer Part Number
NE5210
Description
Transimpedance amplifier 280MHz
Manufacturer
Philips
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
NE5210D
Manufacturer:
NXP/恩智浦
Quantity:
20 000
1. Test condition: output quiescent voltage variation is less than 100mV for 3mA load current.
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
Min and Max limits apply over operating temperature range at V
T
NOTES:
AC ELECTRICAL CHARACTERISTICS
Typical data and Min/Max limits apply at V
1995 Apr 26
SYMBOL
SYMBOL
V
V
V
I
I
I
I
SYMBOL
SYMBOL
R
R
R
R
f
R
C
I
I
I
I
I
PSRR
PSRR
PSRR
PSRR
A
CC
OMAX
IN
INMAX
3dB
N
T
T
T
T
=25 C.
R/ V
R/ T
IN
O
OS
Transimpedance amplifier (280MHz)
T
O
T
O
IN
IN
Input bias voltage
Output bias voltage
Output offset voltage
Supply current
Output sink/source current
Input current (2% linearity)
Maximum input current
overload threshold
Transresistance
Output resistance
Transresistance
Output resistance
Bandwidth (-3dB)
Input resistance
Input capacitance
Transresistance power
Transresistance ambient
temperature sensitivity
RMS noise current spectral density
(referred to input)
Integrated RMS noise current over
Integrated RMS noise current over
the bandwidth (referred to input)
the bandwidth (referred to input)
the bandwidth (referred to input)
C
C
C
C
C
Power supply rejection ratio
(V
Power supply rejection ratio
(V
Power supply rejection ratio
(V
Power supply rejection ratio
configuration)
supply sensitivity
S
S
S
S
S
S
(differential output)
(differential output)
(single-ended output)
(single-ended output)
CC1
CC1
CC2
=0
=0
=0
=1pF
=1pF
=1pF
1
1
1
=V
)
)
CC2
PARAMETER
PARAMETER
PARAMETER
PARAMETER
)
1
2
2
2
2
CC
(ECL
=5V and T
Equivalent AC test circuit 3
Equivalent AC test circuit 4
Equivalent AC test circuit 5
Test Circuit 8, Procedure 4
Test Circuit 8, Procedure 1
Test Circuit 8, Procedure 2
f=0.1MHz, Test Circuit 6
Test Circuit 1, T
A
DC tested, V
DC tested, V
DC tested, V
TEST CONDITIONS
TEST CONDITIONS
TEST CONDITIONS
TEST CONDITIONS
=25 C.
f=10MHz, T
DC tested, R
DC tested, R
T
A
Test Circuit 2
Test Circuit 2
V
=T
DC tested
DC tested
CC
T
f=100MHz
f=200MHz
f=300MHz
f=100MHz
f=200MHz
f=300MHz
A
CC
A MAX
=5 0.5V
=25 C
=5V, unless otherwise specified. Typical data applies at V
A
-T
CC
CC
CC
=25 C
A
L
L
A MIN
2
=25 C
=
=
=0.1V
=0.1V
=0.1V
2.45
Min
Min
200
0.6
2.8
4.9
21
120
160
16
20
20
3
8
LIMITS
LIMITS
0.05
Typ
Typ
280
0.8
3.3
3.5
7.5
9.6
3.5
26
160
240
30
15
60
37
56
71
40
66
89
36
36
65
23
0
4
7
Max
0.95
Max
3.7
0.1
80
32
10
42
21
20
Product specification
CC
5
6
=5V and
NE5210
pA/ Hz
UNIT
UNIT
UNIT
UNIT
%/ C
MHz
%/V
mV
mA
mA
k
k
pF
nA
nA
nA
nA
dB
dB
dB
dB
V
V
A
A

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